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Title: A peak position comparison method for high-speed quantitative Laue microdiffraction data processing

Abstract

Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here in this paper, a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy.

Authors:
 [1]; ORCiD logo [1];  [2]
  1. Xi'an Jiaotong Univ., Shaanxi (China). Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), State Key Lab. for Mechanical Behavior of Materials
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1419469
Alternate Identifier(s):
OSTI ID: 1549939
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Scripta Materialia
Additional Journal Information:
Journal Volume: 143; Journal Issue: C; Journal ID: ISSN 1359-6462
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Polychromatic X-ray Laue microdiffraction; Orientation mapping; Phase distribution; Plastic deformation

Citation Formats

Kou, Jiawei, Chen, Kai, and Tamura, Nobumichi. A peak position comparison method for high-speed quantitative Laue microdiffraction data processing. United States: N. p., 2018. Web. doi:10.1016/j.scriptamat.2017.09.005.
Kou, Jiawei, Chen, Kai, & Tamura, Nobumichi. A peak position comparison method for high-speed quantitative Laue microdiffraction data processing. United States. doi:10.1016/j.scriptamat.2017.09.005.
Kou, Jiawei, Chen, Kai, and Tamura, Nobumichi. Wed . "A peak position comparison method for high-speed quantitative Laue microdiffraction data processing". United States. doi:10.1016/j.scriptamat.2017.09.005. https://www.osti.gov/servlets/purl/1419469.
@article{osti_1419469,
title = {A peak position comparison method for high-speed quantitative Laue microdiffraction data processing},
author = {Kou, Jiawei and Chen, Kai and Tamura, Nobumichi},
abstractNote = {Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here in this paper, a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy.},
doi = {10.1016/j.scriptamat.2017.09.005},
journal = {Scripta Materialia},
number = C,
volume = 143,
place = {United States},
year = {2018},
month = {9}
}

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