Quantifying Soiling Loss Directly From PV Yield

Journal Article · 22 January 2018 · IEEE Journal of Photovoltaics

DOI: https://doi.org/10.1109/JPHOTOV.2017.2784682 · OSTI ID:1419409

Deceglie, Michael G.  ^[1]; Micheli, Leonardo  ^[1]; Muller, Matthew ^[1]

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1. National Renewable Energy Lab. (NREL), Golden, CO (United States)

Soiling of photovoltaic (PV) panels is typically quantified through the use of specialized sensors. Here, we describe and validate a method for estimating soiling loss experienced by PV systems directly from system yield without the need for precipitation data. The method, termed the stochastic rate and recovery (SRR) method, automatically detects soiling intervals in a dataset, then stochastically generates a sample of possible soiling profiles based on the observed characteristics of each interval. In this paper, we describe the method, validate it against soiling station measurements, and compare it with other PV-yield-based soiling estimation methods. The broader application of the SRR method will enable the fleet scale assessment of soiling loss to facilitate mitigation planning and risk assessment.

• Research Organization: National Renewable Energy Laboratory (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
• Grant/Contract Number: AC36-08GO28308
• OSTI ID: 1419409
• Report Number(s): NREL/JA--5J00-70668
• Journal Information: IEEE Journal of Photovoltaics, Journal Name: IEEE Journal of Photovoltaics Journal Issue: 2 Vol. 8; ISSN 2156-3381
• Publisher: IEEECopyright Statement
• Country of Publication: United States
• Language: English