skip to main content

DOE PAGESDOE PAGES

This content will become publicly available on January 19, 2019

Title: Thermoreflectance imaging of electromigration evolution in asymmetric aluminum constrictions


Tian, Hao, Ahn, Woojin, Maize, Kerry, Si, Mengwei, Ye, Peide, Alam, Muhammad Ashraful, Shakouri, Ali, and Bermel, Peter. Thermoreflectance imaging of electromigration evolution in asymmetric aluminum constrictions. United States: N. p., Web. doi:10.1063/1.5005938.
Tian, Hao, Ahn, Woojin, Maize, Kerry, Si, Mengwei, Ye, Peide, Alam, Muhammad Ashraful, Shakouri, Ali, & Bermel, Peter. Thermoreflectance imaging of electromigration evolution in asymmetric aluminum constrictions. United States. doi:10.1063/1.5005938.
Tian, Hao, Ahn, Woojin, Maize, Kerry, Si, Mengwei, Ye, Peide, Alam, Muhammad Ashraful, Shakouri, Ali, and Bermel, Peter. 2018. "Thermoreflectance imaging of electromigration evolution in asymmetric aluminum constrictions". United States. doi:10.1063/1.5005938.
@article{osti_1417524,
title = {Thermoreflectance imaging of electromigration evolution in asymmetric aluminum constrictions},
author = {Tian, Hao and Ahn, Woojin and Maize, Kerry and Si, Mengwei and Ye, Peide and Alam, Muhammad Ashraful and Shakouri, Ali and Bermel, Peter},
abstractNote = {},
doi = {10.1063/1.5005938},
journal = {Journal of Applied Physics},
number = 3,
volume = 123,
place = {United States},
year = {2018},
month = {1}
}

Works referenced in this record:

Electromigration—A brief survey and some recent results
journal, April 1969

Electromigration in thin aluminum films on titanium nitride
journal, April 1976
  • Blech, I. A.
  • Journal of Applied Physics, Vol. 47, Issue 4, p. 1203-1208
  • DOI: 10.1063/1.322842