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Title: Depth distribution of secondary phases in kesterite Cu 2ZnSnS 4 by angle-resolved X-ray absorption spectroscopy

The depth distribution of secondary phases in the solar cell absorber material Cu 2ZnSnS 4 (CZTS) is quantitatively investigated using X-ray Absorption Near Edge Structure (XANES) analysis at the K-edge of sulfur at varying incidence angles. Varying information depths from several nanometers up to the full thickness is achieved. A quantitative profile of the phase distribution is obtained by a self-consistent fit of a multilayer model to the XANES spectra for different angles. Single step co-evaporated CZTS thin-films are found to exhibit zinc and copper sulfide secondary phases preferentially at the front or back interfaces of the film.
Authors:
ORCiD logo [1] ; ORCiD logo [2] ;  [3] ; ORCiD logo [2] ;  [4]
  1. Helmholtz-Zentrum Berlin fur Materialien und Energie GmbH, Berlin (Germany). Department Structure and Dynamics of Energy Materials; Fakultat 4-Physik, Bergische Universitat Wuppertal (Germany)
  2. Fakultat 4-Physik, Bergische Universitat Wuppertal (Germany)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)
  4. Helmholtz-Zentrum Berlin fur Materialien und Energie GmbH, Berlin (Germany)
Publication Date:
Grant/Contract Number:
AC02-76SF00515
Type:
Accepted Manuscript
Journal Name:
APL Materials
Additional Journal Information:
Journal Volume: 5; Journal Issue: 12; Journal ID: ISSN 2166-532X
Publisher:
American Institute of Physics (AIP)
Research Org:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE
OSTI Identifier:
1417336