Adsorption of silica colloids onto like-charged silica surfaces of different roughness
Abstract
Particle adsorption was explored in a model optical polishing system, consisting of silica colloids and like-charged silica surfaces. The adsorption was monitored in situ under various suspension conditions, in the absence of surfactants or organic modifiers, using a quartz crystal microbalance with dissipation monitoring (QCM-D). Changes in surface coverage with particle concentration, particle size, pH, ionic strength and ionic composition were quantified by QCM-D and further characterized ex situ by atomic force microscopy (AFM). A Monte Carlo model was used to describe the kinetics of particle deposition and provide insights on scaling with particle concentration. Transitions from near-zero adsorption to measurable adsorption were compared with equilibrium predictions made using the Deraguin-Verwey-Landau-Overbeek (DLVO) theory. In addition, the impact of silica surface roughness on the propensity for particle adsorption was studied on various spatial scale lengths by intentionally roughening the QCM sensor surface using polishing methods. It was found that a change in silica surface roughness at the AFM scale from 1.3 nm root-mean-square (rms) to 2.7 nm rms resulted in an increase in silica particle adsorption of 3-fold for 50-nm diameter particles and 1.3-fold for 100-nm diameter particles—far exceeding adsorption observed by altering suspension conditions alone, potentially because roughness at themore »
- Authors:
-
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Publication Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1348992
- Alternate Identifier(s):
- OSTI ID: 1417107
- Report Number(s):
- LLNL-JRNL-707117
Journal ID: ISSN 0927-7757
- Grant/Contract Number:
- AC52-07NA27344; LLNL-JRNL-707117
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Colloids and Surfaces. A, Physicochemical and Engineering Aspects
- Additional Journal Information:
- Journal Volume: 520; Journal Issue: C; Journal ID: ISSN 0927-7757
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; Colloidal silica; Adsorption; QCM; DLVO theory; Surface roughness; Polishing
Citation Formats
Dylla-Spears, R., Wong, L., Shen, N., Steele, W., Menapace, J., Miller, P., Feit, M., and Suratwala, T. Adsorption of silica colloids onto like-charged silica surfaces of different roughness. United States: N. p., 2017.
Web. doi:10.1016/j.colsurfa.2017.01.042.
Dylla-Spears, R., Wong, L., Shen, N., Steele, W., Menapace, J., Miller, P., Feit, M., & Suratwala, T. Adsorption of silica colloids onto like-charged silica surfaces of different roughness. United States. https://doi.org/10.1016/j.colsurfa.2017.01.042
Dylla-Spears, R., Wong, L., Shen, N., Steele, W., Menapace, J., Miller, P., Feit, M., and Suratwala, T. Tue .
"Adsorption of silica colloids onto like-charged silica surfaces of different roughness". United States. https://doi.org/10.1016/j.colsurfa.2017.01.042. https://www.osti.gov/servlets/purl/1348992.
@article{osti_1348992,
title = {Adsorption of silica colloids onto like-charged silica surfaces of different roughness},
author = {Dylla-Spears, R. and Wong, L. and Shen, N. and Steele, W. and Menapace, J. and Miller, P. and Feit, M. and Suratwala, T.},
abstractNote = {Particle adsorption was explored in a model optical polishing system, consisting of silica colloids and like-charged silica surfaces. The adsorption was monitored in situ under various suspension conditions, in the absence of surfactants or organic modifiers, using a quartz crystal microbalance with dissipation monitoring (QCM-D). Changes in surface coverage with particle concentration, particle size, pH, ionic strength and ionic composition were quantified by QCM-D and further characterized ex situ by atomic force microscopy (AFM). A Monte Carlo model was used to describe the kinetics of particle deposition and provide insights on scaling with particle concentration. Transitions from near-zero adsorption to measurable adsorption were compared with equilibrium predictions made using the Deraguin-Verwey-Landau-Overbeek (DLVO) theory. In addition, the impact of silica surface roughness on the propensity for particle adsorption was studied on various spatial scale lengths by intentionally roughening the QCM sensor surface using polishing methods. It was found that a change in silica surface roughness at the AFM scale from 1.3 nm root-mean-square (rms) to 2.7 nm rms resulted in an increase in silica particle adsorption of 3-fold for 50-nm diameter particles and 1.3-fold for 100-nm diameter particles—far exceeding adsorption observed by altering suspension conditions alone, potentially because roughness at the proper scale reduces the total separation distance between particle and surface.},
doi = {10.1016/j.colsurfa.2017.01.042},
journal = {Colloids and Surfaces. A, Physicochemical and Engineering Aspects},
number = C,
volume = 520,
place = {United States},
year = {Tue Jan 17 00:00:00 EST 2017},
month = {Tue Jan 17 00:00:00 EST 2017}
}
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Works referencing / citing this record:
Influence of partial charge on the material removal rate during chemical polishing
journal, September 2018
- Suratwala, Tayyab; Steele, Rusty; Miller, Philip E.
- Journal of the American Ceramic Society, Vol. 102, Issue 4