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Title: Fluctuation microscopy analysis of amorphous silicon models

Authors:
; ORCiD logo
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1416656
Grant/Contract Number:  
PS02-09ER09-01
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Name: Ultramicroscopy Journal Volume: 176 Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Gibson, J. M., and Treacy, M. M. J. Fluctuation microscopy analysis of amorphous silicon models. Netherlands: N. p., 2017. Web. doi:10.1016/j.ultramic.2017.01.013.
Gibson, J. M., & Treacy, M. M. J. Fluctuation microscopy analysis of amorphous silicon models. Netherlands. doi:10.1016/j.ultramic.2017.01.013.
Gibson, J. M., and Treacy, M. M. J. Mon . "Fluctuation microscopy analysis of amorphous silicon models". Netherlands. doi:10.1016/j.ultramic.2017.01.013.
@article{osti_1416656,
title = {Fluctuation microscopy analysis of amorphous silicon models},
author = {Gibson, J. M. and Treacy, M. M. J.},
abstractNote = {},
doi = {10.1016/j.ultramic.2017.01.013},
journal = {Ultramicroscopy},
number = C,
volume = 176,
place = {Netherlands},
year = {2017},
month = {5}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.ultramic.2017.01.013

Citation Metrics:
Cited by: 4 works
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