Fluctuation microscopy analysis of amorphous silicon models

Gibson, J. M.; Treacy, M. M. J.

doi:10.1016/j.ultramic.2017.01.013

Title: Fluctuation microscopy analysis of amorphous silicon models

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Authors:

Gibson, J. M.;

Publication Date:: 2017-05-01

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1416656

Grant/Contract Number:: PS02-09ER09-01

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Ultramicroscopy

Additional Journal Information:: Journal Name: Ultramicroscopy Journal Volume: 176 Journal Issue: C; Journal ID: ISSN 0304-3991

Publisher:: Elsevier

Country of Publication:: Netherlands

Language:: English

Citation Formats


                    Gibson, J. M., and Treacy, M. M. J.. Fluctuation microscopy analysis of amorphous silicon models.  Netherlands: N. p., 2017. 
Web.  doi:10.1016/j.ultramic.2017.01.013.

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                    Gibson, J. M., & Treacy, M. M. J.. Fluctuation microscopy analysis of amorphous silicon models.  Netherlands.  https://doi.org/10.1016/j.ultramic.2017.01.013

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                    Gibson, J. M., and Treacy, M. M. J.. Mon .  
"Fluctuation microscopy analysis of amorphous silicon models".  Netherlands.  https://doi.org/10.1016/j.ultramic.2017.01.013.

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@article{osti_1416656,

  title        = {Fluctuation microscopy analysis of amorphous silicon models},

  author       = {Gibson, J. M. and Treacy, M. M. J.},

  abstractNote = {},

  doi          = {10.1016/j.ultramic.2017.01.013},

  journal      = {Ultramicroscopy},

  number       = C,

  volume       = 176,

  place        = {Netherlands},

  year         = {2017},

  month        = {5}

}

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