Fluctuation microscopy analysis of amorphous silicon models

Journal Article · 01 May 2017 · Ultramicroscopy

DOI: https://doi.org/10.1016/j.ultramic.2017.01.013 · OSTI ID:1416656

Gibson, J. M.; Treacy, M. M. J.

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• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES)
• OSTI ID: 1416656
• Journal Information: Ultramicroscopy, Journal Name: Ultramicroscopy Journal Issue: C Vol. 176; ISSN 0304-3991
• Publisher: ElsevierCopyright Statement
• Country of Publication: Netherlands
• Language: English