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Title: Fluctuation microscopy analysis of amorphous silicon models

Journal Article · · Ultramicroscopy

Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
PS02-09ER09-01
OSTI ID:
1416656
Journal Information:
Ultramicroscopy, Journal Name: Ultramicroscopy Vol. 176 Journal Issue: C; ISSN 0304-3991
Publisher:
ElsevierCopyright Statement
Country of Publication:
Netherlands
Language:
English
Citation Metrics:
Cited by: 7 works
Citation information provided by
Web of Science