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Title: Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips

ORCiD logo [1];  [1];  [1]
  1. Department of Mechanical Engineering, University of California Merced, 5200 North Lake Road, Merced, California 95343, USA
Publication Date:
Sponsoring Org.:
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Grant/Contract Number:  
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Name: Journal of Applied Physics Journal Volume: 123 Journal Issue: 1; Journal ID: ISSN 0021-8979
American Institute of Physics
Country of Publication:
United States

Citation Formats

Zade, Vishal, Kang, Hung-Sen, and Lee, Min Hwan. Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips. United States: N. p., 2018. Web. doi:10.1063/1.5006080.
Zade, Vishal, Kang, Hung-Sen, & Lee, Min Hwan. Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips. United States. doi:10.1063/1.5006080.
Zade, Vishal, Kang, Hung-Sen, and Lee, Min Hwan. Sun . "Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips". United States. doi:10.1063/1.5006080.
title = {Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips},
author = {Zade, Vishal and Kang, Hung-Sen and Lee, Min Hwan},
abstractNote = {},
doi = {10.1063/1.5006080},
journal = {Journal of Applied Physics},
number = 1,
volume = 123,
place = {United States},
year = {2018},
month = {1}

Journal Article:
Free Publicly Available Full Text
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DOI: 10.1063/1.5006080

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