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This content will become publicly available on January 3, 2019

Title: Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips

Authors:
ORCiD logo [1] ;  [1] ;  [1]
  1. Department of Mechanical Engineering, University of California Merced, 5200 North Lake Road, Merced, California 95343, USA
Publication Date:
Grant/Contract Number:
AC02-05CH11231
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Name: Journal of Applied Physics Journal Volume: 123 Journal Issue: 1; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1415510

Zade, Vishal, Kang, Hung-Sen, and Lee, Min Hwan. Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips. United States: N. p., Web. doi:10.1063/1.5006080.
Zade, Vishal, Kang, Hung-Sen, & Lee, Min Hwan. Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips. United States. doi:10.1063/1.5006080.
Zade, Vishal, Kang, Hung-Sen, and Lee, Min Hwan. 2018. "Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips". United States. doi:10.1063/1.5006080.
@article{osti_1415510,
title = {Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips},
author = {Zade, Vishal and Kang, Hung-Sen and Lee, Min Hwan},
abstractNote = {},
doi = {10.1063/1.5006080},
journal = {Journal of Applied Physics},
number = 1,
volume = 123,
place = {United States},
year = {2018},
month = {1}
}

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Nanoscale Joule heating, Peltier cooling and current crowding at graphene–metal contacts
journal, April 2011
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  • Nature Nanotechnology, Vol. 6, Issue 5, p. 287-290
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