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Title: Understanding Quality Factor Degradation in Superconducting Niobium Cavities at Low Microwave Field Amplitudes

Authors:
;
Publication Date:
Research Org.:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
OSTI Identifier:
1415053
Alternate Identifier(s):
OSTI ID: 1454719
Report Number(s):
FERMILAB-PUB-17-269-TD; arXiv:1705.05982
Journal ID: ISSN 0031-9007; PRLTAO; 264801
Grant/Contract Number:  
AC02-07CH11359
Resource Type:
Published Article
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Name: Physical Review Letters Journal Volume: 119 Journal Issue: 26; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS

Citation Formats

Romanenko, A., and Schuster, D. I. Understanding Quality Factor Degradation in Superconducting Niobium Cavities at Low Microwave Field Amplitudes. United States: N. p., 2017. Web. doi:10.1103/PhysRevLett.119.264801.
Romanenko, A., & Schuster, D. I. Understanding Quality Factor Degradation in Superconducting Niobium Cavities at Low Microwave Field Amplitudes. United States. doi:10.1103/PhysRevLett.119.264801.
Romanenko, A., and Schuster, D. I. Thu . "Understanding Quality Factor Degradation in Superconducting Niobium Cavities at Low Microwave Field Amplitudes". United States. doi:10.1103/PhysRevLett.119.264801.
@article{osti_1415053,
title = {Understanding Quality Factor Degradation in Superconducting Niobium Cavities at Low Microwave Field Amplitudes},
author = {Romanenko, A. and Schuster, D. I.},
abstractNote = {},
doi = {10.1103/PhysRevLett.119.264801},
journal = {Physical Review Letters},
number = 26,
volume = 119,
place = {United States},
year = {2017},
month = {12}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevLett.119.264801

Citation Metrics:
Cited by: 4 works
Citation information provided by
Web of Science

Figures / Tables:

FIG. 1 FIG. 1: Decay of cavity output power upon turning the RF source off. At each moment in time t0, time decay can be characterized by the “instantaneous” time constant τ(t0), from which the loaded quality factor QL is obtained. Dashed lines reflect the noise floor in the respective configurations.

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    Works referencing / citing this record:

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