skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Toward Scintillator High-Gain Avalanche Rushing Photoconductor Active Matrix Flat Panel Imager (SHARP-AMFPI): Initial fabrication and characterization

Authors:
 [1];  [1];  [2];  [2];  [1];  [1]
  1. Department of Radiology, Stony Brook University, Stony Brook NY 11794 USA
  2. Analogic Canada, Montreal QC H4R 2P1 Canada
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1414005
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Medical Physics
Additional Journal Information:
Journal Name: Medical Physics Journal Volume: 45 Journal Issue: 2; Journal ID: ISSN 0094-2405
Publisher:
Wiley Blackwell (John Wiley & Sons)
Country of Publication:
United States
Language:
English

Citation Formats

Scheuermann, James R., Howansky, Adrian, Hansroul, Marc, Léveillé, Sébastien, Tanioka, Kenkichi, and Zhao, Wei. Toward Scintillator High-Gain Avalanche Rushing Photoconductor Active Matrix Flat Panel Imager (SHARP-AMFPI): Initial fabrication and characterization. United States: N. p., 2017. Web. doi:10.1002/mp.12693.
Scheuermann, James R., Howansky, Adrian, Hansroul, Marc, Léveillé, Sébastien, Tanioka, Kenkichi, & Zhao, Wei. Toward Scintillator High-Gain Avalanche Rushing Photoconductor Active Matrix Flat Panel Imager (SHARP-AMFPI): Initial fabrication and characterization. United States. doi:10.1002/mp.12693.
Scheuermann, James R., Howansky, Adrian, Hansroul, Marc, Léveillé, Sébastien, Tanioka, Kenkichi, and Zhao, Wei. Mon . "Toward Scintillator High-Gain Avalanche Rushing Photoconductor Active Matrix Flat Panel Imager (SHARP-AMFPI): Initial fabrication and characterization". United States. doi:10.1002/mp.12693.
@article{osti_1414005,
title = {Toward Scintillator High-Gain Avalanche Rushing Photoconductor Active Matrix Flat Panel Imager (SHARP-AMFPI): Initial fabrication and characterization},
author = {Scheuermann, James R. and Howansky, Adrian and Hansroul, Marc and Léveillé, Sébastien and Tanioka, Kenkichi and Zhao, Wei},
abstractNote = {},
doi = {10.1002/mp.12693},
journal = {Medical Physics},
number = 2,
volume = 45,
place = {United States},
year = {2017},
month = {12}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1002/mp.12693

Citation Metrics:
Cited by: 2 works
Citation information provided by
Web of Science

Save / Share:

Works referenced in this record:

Dark current in multilayer stabilized amorphous selenium based photoconductive x-ray detectors
journal, July 2012

  • Frey, Joel B.; Belev, George; Tousignant, Olivier
  • Journal of Applied Physics, Vol. 112, Issue 1
  • DOI: 10.1063/1.4730135

Deriving depth-dependent light escape efficiency and optical Swank factor from measured pulse height spectra of scintillators
journal, February 2017

  • Howansky, Adrian; Peng, Boyu; Lubinsky, Anthony R.
  • Medical Physics, Vol. 44, Issue 3
  • DOI: 10.1002/mp.12083

Development of solid-state avalanche amorphous selenium for medical imaging: Solid-state avalanche amorphous selenium sensor
journal, February 2015

  • Scheuermann, James R.; Goldan, Amir H.; Tousignant, Olivier
  • Medical Physics, Vol. 42, Issue 3
  • DOI: 10.1118/1.4907971

Charge transport model in solid-state avalanche amorphous selenium and defect suppression design
journal, January 2016

  • Scheuermann, James R.; Miranda, Yesenia; Liu, Hongyu
  • Journal of Applied Physics, Vol. 119, Issue 2
  • DOI: 10.1063/1.4939602

Digital radiology using active matrix readout: Amplified pixel detector array for fluoroscopy
journal, May 1999

  • Matsuura, Naomi; Zhao, Wei; Huang, Zhongshou
  • Medical Physics, Vol. 26, Issue 5
  • DOI: 10.1118/1.598572

Relaxation effects in glassy selenium
journal, January 1976


a−Si:H/CsI(Tl) flat-panel versus computed radiography for chest imaging applications: image quality metrics measurement
journal, December 2003

  • Liu, Xinming; Shaw, Chris C.
  • Medical Physics, Vol. 31, Issue 1
  • DOI: 10.1118/1.1625102

Impact ionization and mobilities of charge carriers at high electric fields in amorphous selenium
journal, May 1980


Avalanche multiplication in amorphous selenium and its utilization in imaging
journal, May 2008


Avalanche Characteristics of the Te-Doped Amorphous Se Photoconductive Target for a Complementary Metal-Oxide-Semiconductor Image Sensor
journal, March 2006

  • Park, Wug-Dong; Tanioka, Kenkichi
  • Japanese Journal of Applied Physics, Vol. 45, Issue No. 11
  • DOI: 10.1143/JJAP.45.L307

Active pixel image sensor for large-area medical imaging
conference, June 2003

  • Karim, Karim S.; Vygranenko, Yurii K.; Avila-Munoz, Alfredo
  • Medical Imaging 2003, SPIE Proceedings
  • DOI: 10.1117/12.480254

A simple method for determining the modulation transfer function in digital radiography
journal, March 1992

  • Fujita, H.; Tsai, D. -Y.; Itoh, T.
  • IEEE Transactions on Medical Imaging, Vol. 11, Issue 1
  • DOI: 10.1109/42.126908

Electroded avalanche amorphous selenium (a-Se) photosensor
journal, May 2012

  • Bubon, Oleksandr; DeCrescenzo, Giovanni; Zhao, Wei
  • Current Applied Physics, Vol. 12, Issue 3
  • DOI: 10.1016/j.cap.2011.12.023

Solid-state flat panel imager with avalanche amorphous selenium
conference, March 2016

  • Scheuermann, James R.; Howansky, Adrian; Goldan, Amir H.
  • SPIE Medical Imaging, SPIE Proceedings
  • DOI: 10.1117/12.2217002

Electronic noise analysis of a 127-μm pixel TFT/photodiode array
conference, June 2001

  • Weisfield, Richard L.; Bennett, N. Robert
  • Medical Imaging 2001, SPIE Proceedings
  • DOI: 10.1117/12.430955

Onsager mechanism of photogeneration in amorphous selenium
journal, June 1975


High-Gain Avalanche Rushing amorphous Photoconductor (HARP) detector
journal, September 2009

  • Tanioka, K.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 608, Issue 1
  • DOI: 10.1016/j.nima.2009.05.066

A CMOS imager hybridized to an avalanche multiplied film
journal, January 1997

  • Takiguchi, Y.; Maruyama, H.; Kosugi, M.
  • IEEE Transactions on Electron Devices, Vol. 44, Issue 10
  • DOI: 10.1109/16.628837