Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials

Du, Ming; Jacobsen, Chris

doi:10.1016/j.ultramic.2017.10.003

Title: Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials

Journal Article · 07 October 2017 · Ultramicroscopy

DOI: https://doi.org/10.1016/j.ultramic.2017.10.003 · OSTI ID:1411044

Du, Ming ^[1]; Jacobsen, Chris ^[2]

Northwestern Univ., Evanston, IL (United States)
Argonne National Lab. (ANL), Argonne, IL (United States); Northwestern Univ., Evanston, IL (United States)

Electron and x-ray microscopes allow one to image the entire, unlabeled structure of hydrated materials at a resolution well beyond what visible light microscopes can achieve. However, both approaches involve ionizing radiation, so that radiation damage must be considered as one of the limits to imaging. Drawing upon earlier work, we describe here a unified approach to estimating the image contrast (and thus the required exposure and corresponding radiation dose) in both x-ray and electron microscopy. This approach accounts for factors such as plural and inelastic scattering, and (in electron microscopy) the use of energy filters to obtain so-called "zero loss" images. As expected, it shows that electron microscopy offers lower dose for specimens thinner than about 1 mu m (such as for studies of macromolecules, viruses, bacteria and archaebacteria, and thin sectioned material), while x-ray microscopy offers superior characteristics for imaging thicker specimen such as whole eukaryotic cells, thick-sectioned tissues, and organs. The required radiation dose scales strongly as a function of the desired spatial resolution, allowing one to understand the limits of live and frozen hydrated specimen imaging. Lastly, we consider the factors limiting x-ray microscopy of thicker materials, suggesting that specimens as thick as a whole mouse brain can be imaged with x-ray microscopes without significant image degradation should appropriate image reconstruction methods be identified.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: National Institutes of Health (NIH); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22), Scientific User Facilities Division; USDOE

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1411044

Alternate ID(s):: OSTI ID: 1549479

Journal Information:: Ultramicroscopy, Vol. 184, Issue PA; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 27 works

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Title: Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials

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