skip to main content

DOE PAGESDOE PAGES

This content will become publicly available on November 30, 2018

Title: Electronic Transport and Ferroelectric Switching in Ion-Bombarded, Defect-Engineered BiFeO 3 Thin Films

Authors:
ORCiD logo [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [2]
  1. Department of Materials Science and Engineering, University of California, Berkeley, Berkeley CA 94720 USA
  2. Department of Materials Science and Engineering, University of California, Berkeley, Berkeley CA 94720 USA, Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley CA 94720 USA
Publication Date:
Grant/Contract Number:
SC-0012375
Type:
Publisher's Accepted Manuscript
Journal Name:
Advanced Materials Interfaces
Additional Journal Information:
Journal Volume: 5; Journal Issue: 3; Related Information: CHORUS Timestamp: 2018-02-06 07:20:07; Journal ID: ISSN 2196-7350
Publisher:
Wiley Blackwell (John Wiley & Sons)
Sponsoring Org:
USDOE
Country of Publication:
Germany
Language:
English
OSTI Identifier:
1410720