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Title: Round Robin Test of Residual Resistance Ratio of Nb$$_3$$Sn Composite Superconductors

A round robin test of residual resistance ratio (RRR) was performed for Nb 3Sn composite superconductors prepared by internal tin method by six institutes with the international standard test method described in IEC 61788-4. It was found that uncertainty mainly resulted from determination of the cryogenic resistance from the intersection of two straight lines drawn to fit the voltage vs. temperature curve around the resistive transition. As a result, the measurement clarified that RRR can be measured with expanded uncertainty not larger than 5% with the coverage factor 2 by using this test method.
Authors:
 [1] ;  [2] ;  [3] ;  [3] ;  [4] ;  [5] ;  [6] ;  [7] ;  [7] ;  [8] ;  [8]
  1. Kyushu Institute of Technology, Iizuka (Japan)
  2. Kyushu Kogyo Daigaku, Iizuka (Japan)
  3. Yeungnam Univ., Gyeongsangbuk-do (Republic of Korea)
  4. Western Superconducting Technologies, Xi'an (China)
  5. ASIPP, Hefei (China)
  6. Chinese Academy of Science, Hefei (China)
  7. Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
  8. Superconductivity Group, Durham (United Kingdom of Great Britain and Northern Ireland)
Publication Date:
Report Number(s):
FERMILAB-PUB-17-093-TD
Journal ID: ISSN 1051-8223; 1638932; TRN: US1800107
Grant/Contract Number:
AC02-07CH11359
Type:
Accepted Manuscript
Journal Name:
IEEE Transactions on Applied Superconductivity
Additional Journal Information:
Journal Volume: 28; Journal Issue: 2; Journal ID: ISSN 1051-8223
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Research Org:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; Nb3Sn composite wire; copper; residual resistance ratio
OSTI Identifier:
1410423

Matsushita, Teruo, Otabe, Edmund Soji, Kim, Dong Ho, Hwang, Taejong, Gao, Huixian, Liu, Fang, Liu, Huajun, Cooley, Lance, Turrioni, Daniele, Raine, Mark J., and Hampshire, Damian P.. Round Robin Test of Residual Resistance Ratio of Nb$_3$Sn Composite Superconductors. United States: N. p., Web. doi:10.1109/TASC.2017.2781182.
Matsushita, Teruo, Otabe, Edmund Soji, Kim, Dong Ho, Hwang, Taejong, Gao, Huixian, Liu, Fang, Liu, Huajun, Cooley, Lance, Turrioni, Daniele, Raine, Mark J., & Hampshire, Damian P.. Round Robin Test of Residual Resistance Ratio of Nb$_3$Sn Composite Superconductors. United States. doi:10.1109/TASC.2017.2781182.
Matsushita, Teruo, Otabe, Edmund Soji, Kim, Dong Ho, Hwang, Taejong, Gao, Huixian, Liu, Fang, Liu, Huajun, Cooley, Lance, Turrioni, Daniele, Raine, Mark J., and Hampshire, Damian P.. 2017. "Round Robin Test of Residual Resistance Ratio of Nb$_3$Sn Composite Superconductors". United States. doi:10.1109/TASC.2017.2781182.
@article{osti_1410423,
title = {Round Robin Test of Residual Resistance Ratio of Nb$_3$Sn Composite Superconductors},
author = {Matsushita, Teruo and Otabe, Edmund Soji and Kim, Dong Ho and Hwang, Taejong and Gao, Huixian and Liu, Fang and Liu, Huajun and Cooley, Lance and Turrioni, Daniele and Raine, Mark J. and Hampshire, Damian P.},
abstractNote = {A round robin test of residual resistance ratio (RRR) was performed for Nb3Sn composite superconductors prepared by internal tin method by six institutes with the international standard test method described in IEC 61788-4. It was found that uncertainty mainly resulted from determination of the cryogenic resistance from the intersection of two straight lines drawn to fit the voltage vs. temperature curve around the resistive transition. As a result, the measurement clarified that RRR can be measured with expanded uncertainty not larger than 5% with the coverage factor 2 by using this test method.},
doi = {10.1109/TASC.2017.2781182},
journal = {IEEE Transactions on Applied Superconductivity},
number = 2,
volume = 28,
place = {United States},
year = {2017},
month = {12}
}