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Title: Twofold twist defect chains at criticality

Authors:
; ; ;
Publication Date:
Grant/Contract Number:
SciDAC FG02-12ER46875
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Name: Physical Review B Journal Volume: 96 Journal Issue: 20; Journal ID: ISSN 2469-9950
Publisher:
American Physical Society
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1410389

Yu, Xiongjie, Chen, Xiao, Roy, Abhishek, and Teo, Jeffrey C. Y.. Twofold twist defect chains at criticality. United States: N. p., Web. doi:10.1103/PhysRevB.96.205435.
Yu, Xiongjie, Chen, Xiao, Roy, Abhishek, & Teo, Jeffrey C. Y.. Twofold twist defect chains at criticality. United States. doi:10.1103/PhysRevB.96.205435.
Yu, Xiongjie, Chen, Xiao, Roy, Abhishek, and Teo, Jeffrey C. Y.. 2017. "Twofold twist defect chains at criticality". United States. doi:10.1103/PhysRevB.96.205435.
@article{osti_1410389,
title = {Twofold twist defect chains at criticality},
author = {Yu, Xiongjie and Chen, Xiao and Roy, Abhishek and Teo, Jeffrey C. Y.},
abstractNote = {},
doi = {10.1103/PhysRevB.96.205435},
journal = {Physical Review B},
number = 20,
volume = 96,
place = {United States},
year = {2017},
month = {11}
}

Works referenced in this record:

Colloquium: Topological insulators
journal, November 2010