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Title: A Seeman–Bohlin geometry for high-resolution nanosecond x-ray diffraction measurements from shocked polycrystalline and amorphous materials [Shock compression measurement in a Seeman-Bohlin camera geometry developed for time-resolved x-ray diffraction studies of shocked polycrystalline and amorphous materials]

Abstract

Here, we report on a focusing x-ray diffraction geometry capable of high-resolution in situ lattice probing from dynamically loaded polycrystalline and amorphous materials. The Seeman–Bohlin-type camera presented here is ideally suited for time-resolved x-ray diffraction measurements performed on high energy multibeam laser platforms. Diffraction from several lattice planes of ablatively shock-loaded 25 μm thick Cu foils was recorded on a focusing circle of diameter D=100 mm with exceptional angular resolution limited only by the spectral broadening of the x-ray source. Excellent agreement was found between the density measured using x-ray diffraction and that inferred from Doppler velocimetry and the known shock Hugoniot of Cu. In addition, x-ray diffraction signal was captured from an amorphous material under static conditions.

Authors:
 [1];  [2];  [2];  [2];  [2];  [2];  [2];  [3]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Univ. of Texas at Austin, Austin, TX (United States)
  2. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  3. Univ. of Texas at Austin, Austin, TX (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1408975
Report Number(s):
LLNL-JRNL-410547
Journal ID: ISSN 0034-6748
Grant/Contract Number:  
AC52-07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 80; Journal Issue: 9; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Milathianaki, Despina, Hawreliak, J., McNaney, J. M., El-Dasher, B. S., Saculla, M. D., Swift, D. C., Lorenzana, H. E., and Ditmire, T. A Seeman–Bohlin geometry for high-resolution nanosecond x-ray diffraction measurements from shocked polycrystalline and amorphous materials [Shock compression measurement in a Seeman-Bohlin camera geometry developed for time-resolved x-ray diffraction studies of shocked polycrystalline and amorphous materials]. United States: N. p., 2009. Web. doi:10.1063/1.3230647.
Milathianaki, Despina, Hawreliak, J., McNaney, J. M., El-Dasher, B. S., Saculla, M. D., Swift, D. C., Lorenzana, H. E., & Ditmire, T. A Seeman–Bohlin geometry for high-resolution nanosecond x-ray diffraction measurements from shocked polycrystalline and amorphous materials [Shock compression measurement in a Seeman-Bohlin camera geometry developed for time-resolved x-ray diffraction studies of shocked polycrystalline and amorphous materials]. United States. doi:10.1063/1.3230647.
Milathianaki, Despina, Hawreliak, J., McNaney, J. M., El-Dasher, B. S., Saculla, M. D., Swift, D. C., Lorenzana, H. E., and Ditmire, T. Wed . "A Seeman–Bohlin geometry for high-resolution nanosecond x-ray diffraction measurements from shocked polycrystalline and amorphous materials [Shock compression measurement in a Seeman-Bohlin camera geometry developed for time-resolved x-ray diffraction studies of shocked polycrystalline and amorphous materials]". United States. doi:10.1063/1.3230647. https://www.osti.gov/servlets/purl/1408975.
@article{osti_1408975,
title = {A Seeman–Bohlin geometry for high-resolution nanosecond x-ray diffraction measurements from shocked polycrystalline and amorphous materials [Shock compression measurement in a Seeman-Bohlin camera geometry developed for time-resolved x-ray diffraction studies of shocked polycrystalline and amorphous materials]},
author = {Milathianaki, Despina and Hawreliak, J. and McNaney, J. M. and El-Dasher, B. S. and Saculla, M. D. and Swift, D. C. and Lorenzana, H. E. and Ditmire, T.},
abstractNote = {Here, we report on a focusing x-ray diffraction geometry capable of high-resolution in situ lattice probing from dynamically loaded polycrystalline and amorphous materials. The Seeman–Bohlin-type camera presented here is ideally suited for time-resolved x-ray diffraction measurements performed on high energy multibeam laser platforms. Diffraction from several lattice planes of ablatively shock-loaded 25 μm thick Cu foils was recorded on a focusing circle of diameter D=100 mm with exceptional angular resolution limited only by the spectral broadening of the x-ray source. Excellent agreement was found between the density measured using x-ray diffraction and that inferred from Doppler velocimetry and the known shock Hugoniot of Cu. In addition, x-ray diffraction signal was captured from an amorphous material under static conditions.},
doi = {10.1063/1.3230647},
journal = {Review of Scientific Instruments},
number = 9,
volume = 80,
place = {United States},
year = {2009},
month = {9}
}

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