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This content will become publicly available on July 7, 2018

Title: Surface plasmons and Bloch surface waves: Towards optimized ultra-sensitive optical sensors

In photonics, the field concentration and enhancement have been major objectives for achieving size reduction and device integration. Plasmonics offers resonant field confinement and enhancement, but ultra-sharp optical resonances in all-dielectric multi-layer thin films are emerging as a powerful contestant. Thus, applications capitalizing upon stronger and sharper optical resonances and larger field enhancements could be faced with a choice for the superior platform. Here in this paper, we present a comparison between plasmonic and dielectric multi-layer thin films for their resonance merits. We show that the remarkable characteristics of the resonance behavior of optimized dielectric multi-layers can outweigh those of their metallic counterpart.
Authors:
ORCiD logo [1] ;  [1] ; ORCiD logo [2] ; ORCiD logo [1]
  1. Aix Marseille Univ., Marseille (France); Centre National de la Recherche Scientifique (CNRS), Marseille (France). Institut Fresnel
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Grant/Contract Number:
AC05-00OR22725
Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 111; Journal Issue: 1; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; Thin films; Optical devices; Surface waves; Dielectric materials; Surface plasmons
OSTI Identifier:
1408584
Alternate Identifier(s):
OSTI ID: 1368603