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Title: Imaging the Thickness of Passivation Layers for Crystalline Silicon with Micron-Scale Spatial Resolution Using Spectral Photoluminescence

Authors:
ORCiD logo [1] ;  [2] ;  [1] ;  [2] ;  [2] ;  [2] ;  [2] ;  [1]
  1. Research School of Engineering The Australian National University, Canberra ACT 2601 Australia
  2. National Renewable Energy Laboratory, Golden CO 80401 USA
Publication Date:
Grant/Contract Number:
AC36-08GO28308
Type:
Publisher's Accepted Manuscript
Journal Name:
Solar RRL
Additional Journal Information:
Journal Name: Solar RRL Journal Volume: 1 Journal Issue: 11; Journal ID: ISSN 2367-198X
Publisher:
Wiley Blackwell (John Wiley & Sons)
Sponsoring Org:
USDOE
Country of Publication:
Germany
Language:
English
OSTI Identifier:
1408156

Nguyen, Hieu T., Johnston, Steve, Basnet, Rabin, Guthrey, Harvey, Dippo, Pat, Zhang, Hanyu, Al-Jassim, Mowafak M., and Macdonald, Daniel. Imaging the Thickness of Passivation Layers for Crystalline Silicon with Micron-Scale Spatial Resolution Using Spectral Photoluminescence. Germany: N. p., Web. doi:10.1002/solr.201700157.
Nguyen, Hieu T., Johnston, Steve, Basnet, Rabin, Guthrey, Harvey, Dippo, Pat, Zhang, Hanyu, Al-Jassim, Mowafak M., & Macdonald, Daniel. Imaging the Thickness of Passivation Layers for Crystalline Silicon with Micron-Scale Spatial Resolution Using Spectral Photoluminescence. Germany. doi:10.1002/solr.201700157.
Nguyen, Hieu T., Johnston, Steve, Basnet, Rabin, Guthrey, Harvey, Dippo, Pat, Zhang, Hanyu, Al-Jassim, Mowafak M., and Macdonald, Daniel. 2017. "Imaging the Thickness of Passivation Layers for Crystalline Silicon with Micron-Scale Spatial Resolution Using Spectral Photoluminescence". Germany. doi:10.1002/solr.201700157.
@article{osti_1408156,
title = {Imaging the Thickness of Passivation Layers for Crystalline Silicon with Micron-Scale Spatial Resolution Using Spectral Photoluminescence},
author = {Nguyen, Hieu T. and Johnston, Steve and Basnet, Rabin and Guthrey, Harvey and Dippo, Pat and Zhang, Hanyu and Al-Jassim, Mowafak M. and Macdonald, Daniel},
abstractNote = {},
doi = {10.1002/solr.201700157},
journal = {Solar RRL},
number = 11,
volume = 1,
place = {Germany},
year = {2017},
month = {10}
}

Works referenced in this record:

Surface passivation of crystalline silicon solar cells: a review
journal, January 2000