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This content will become publicly available on October 30, 2018

Title: Imaging the Thickness of Passivation Layers for Crystalline Silicon with Micron-Scale Spatial Resolution Using Spectral Photoluminescence

Authors:
ORCiD logo [1] ;  [2] ;  [1] ;  [2] ;  [2] ;  [2] ;  [2] ;  [1]
  1. Research School of Engineering The Australian National University, Canberra ACT 2601 Australia
  2. National Renewable Energy Laboratory, Golden CO 80401 USA
Publication Date:
Grant/Contract Number:
AC36-08GO28308
Type:
Publisher's Accepted Manuscript
Journal Name:
Solar RRL
Additional Journal Information:
Journal Volume: 1; Journal Issue: 11; Related Information: CHORUS Timestamp: 2017-11-13 02:48:29; Journal ID: ISSN 2367-198X
Publisher:
Wiley Blackwell (John Wiley & Sons)
Sponsoring Org:
USDOE
Country of Publication:
Germany
Language:
English
OSTI Identifier:
1408156