Focal Spot and Wavefront Sensing of an X-Ray Free Electron laser using Ronchi shearing interferometry
The Linac Coherent Light Source (LCLS) is an X-ray source of unmatched brilliance, that is advancing many scientific fields at a rapid pace. The highest peak intensities that are routinely produced at LCLS take place at the Coherent X-ray Imaging (CXI) instrument, which can produce spotsize at the order of 100 nm, and such spotsizes and intensities are crucial for experiments ranging from coherent diffractive imaging, non-linear x-ray optics and high field physics, and single molecule imaging. Nevertheless, a full characterisation of this beam has up to now not been performed. In this paper we for the first time characterise this nanofocused beam in both phase and intensity using a Ronchi Shearing Interferometric technique. The method is fast, in-situ, uses a straightforward optimization algoritm, and is insensitive to spatial jitter.
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- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. of Hamburg (Germany). Physics Dept.
- Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
- SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
- Publication Date:
- Grant/Contract Number:
- AC02-76SF00515
- Type:
- Accepted Manuscript
- Journal Name:
- Scientific Reports
- Additional Journal Information:
- Journal Volume: 7; Journal Issue: 1; Journal ID: ISSN 2045-2322
- Publisher:
- Nature Publishing Group
- Research Org:
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Sponsoring Org:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE Office of Science (SC), Fusion Energy Sciences (FES) (SC-24)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
- OSTI Identifier:
- 1406117
Nagler, Bob, Aquila, Andrew, Boutet, Sebastien, Galtier, Eric C., Hashim, Akel, S. Hunter, Mark, Liang, Mengning, Sakdinawat, Anne E., Schroer, Christian G., Schropp, Andreas, Seaberg, Matthew H., Seiboth, Frank, van Driel, Tim, Xing, Zhou, Liu, Yanwei, and Lee, Hae Ja. Focal Spot and Wavefront Sensing of an X-Ray Free Electron laser using Ronchi shearing interferometry. United States: N. p.,
Web. doi:10.1038/s41598-017-13710-8.
Nagler, Bob, Aquila, Andrew, Boutet, Sebastien, Galtier, Eric C., Hashim, Akel, S. Hunter, Mark, Liang, Mengning, Sakdinawat, Anne E., Schroer, Christian G., Schropp, Andreas, Seaberg, Matthew H., Seiboth, Frank, van Driel, Tim, Xing, Zhou, Liu, Yanwei, & Lee, Hae Ja. Focal Spot and Wavefront Sensing of an X-Ray Free Electron laser using Ronchi shearing interferometry. United States. doi:10.1038/s41598-017-13710-8.
Nagler, Bob, Aquila, Andrew, Boutet, Sebastien, Galtier, Eric C., Hashim, Akel, S. Hunter, Mark, Liang, Mengning, Sakdinawat, Anne E., Schroer, Christian G., Schropp, Andreas, Seaberg, Matthew H., Seiboth, Frank, van Driel, Tim, Xing, Zhou, Liu, Yanwei, and Lee, Hae Ja. 2017.
"Focal Spot and Wavefront Sensing of an X-Ray Free Electron laser using Ronchi shearing interferometry". United States.
doi:10.1038/s41598-017-13710-8. https://www.osti.gov/servlets/purl/1406117.
@article{osti_1406117,
title = {Focal Spot and Wavefront Sensing of an X-Ray Free Electron laser using Ronchi shearing interferometry},
author = {Nagler, Bob and Aquila, Andrew and Boutet, Sebastien and Galtier, Eric C. and Hashim, Akel and S. Hunter, Mark and Liang, Mengning and Sakdinawat, Anne E. and Schroer, Christian G. and Schropp, Andreas and Seaberg, Matthew H. and Seiboth, Frank and van Driel, Tim and Xing, Zhou and Liu, Yanwei and Lee, Hae Ja},
abstractNote = {The Linac Coherent Light Source (LCLS) is an X-ray source of unmatched brilliance, that is advancing many scientific fields at a rapid pace. The highest peak intensities that are routinely produced at LCLS take place at the Coherent X-ray Imaging (CXI) instrument, which can produce spotsize at the order of 100 nm, and such spotsizes and intensities are crucial for experiments ranging from coherent diffractive imaging, non-linear x-ray optics and high field physics, and single molecule imaging. Nevertheless, a full characterisation of this beam has up to now not been performed. In this paper we for the first time characterise this nanofocused beam in both phase and intensity using a Ronchi Shearing Interferometric technique. The method is fast, in-situ, uses a straightforward optimization algoritm, and is insensitive to spatial jitter.},
doi = {10.1038/s41598-017-13710-8},
journal = {Scientific Reports},
number = 1,
volume = 7,
place = {United States},
year = {2017},
month = {10}
}
- Free Publicly Accessible Full Text
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Accepted Manuscript (DOE)
- Publisher's Version of Record
- https://doi.org/10.1038/s41598-017-13710-8