Simplified model of pinhole imaging for quantifying systematic errors in image shape
Abstract
In this paper, we examine systematic errors in x-ray imaging by pinhole optics for quantifying uncertainties in the measurement of convergence and asymmetry in inertial confinement fusion implosions. We present a quantitative model for the total resolution of a pinhole optic with an imaging detector that more effectively describes the effect of diffraction than models that treat geometry and diffraction as independent. This model can be used to predict loss of shape detail due to imaging across the transition from geometric to diffractive optics. We find that fractional error in observable shapes is proportional to the total resolution element we present and inversely proportional to the length scale of the asymmetry being observed. Finally, we have experimentally validated our results by imaging a single object with differently sized pinholes and with different magnifications.
- Authors:
-
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
- Publication Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1438629
- Alternate Identifier(s):
- OSTI ID: 1405057
- Report Number(s):
- LLNL-JRNL-731989
Journal ID: ISSN 1559-128X
- Grant/Contract Number:
- AC52-07NA27344
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Optics
- Additional Journal Information:
- Journal Volume: 56; Journal Issue: 31; Journal ID: ISSN 1559-128X
- Publisher:
- Optical Society of America
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; imaging ultrafast phenomena; image analysis; plasmas; picosecond phenomena; x-ray imaging
Citation Formats
Benedetti, Laura Robin, Izumi, N., Khan, S. F., Kyrala, G. A., Landen, O. L., Ma, T., Nagel, S. R., and Pak, A. Simplified model of pinhole imaging for quantifying systematic errors in image shape. United States: N. p., 2017.
Web. doi:10.1364/AO.56.008719.
Benedetti, Laura Robin, Izumi, N., Khan, S. F., Kyrala, G. A., Landen, O. L., Ma, T., Nagel, S. R., & Pak, A. Simplified model of pinhole imaging for quantifying systematic errors in image shape. United States. https://doi.org/10.1364/AO.56.008719
Benedetti, Laura Robin, Izumi, N., Khan, S. F., Kyrala, G. A., Landen, O. L., Ma, T., Nagel, S. R., and Pak, A. Mon .
"Simplified model of pinhole imaging for quantifying systematic errors in image shape". United States. https://doi.org/10.1364/AO.56.008719. https://www.osti.gov/servlets/purl/1438629.
@article{osti_1438629,
title = {Simplified model of pinhole imaging for quantifying systematic errors in image shape},
author = {Benedetti, Laura Robin and Izumi, N. and Khan, S. F. and Kyrala, G. A. and Landen, O. L. and Ma, T. and Nagel, S. R. and Pak, A.},
abstractNote = {In this paper, we examine systematic errors in x-ray imaging by pinhole optics for quantifying uncertainties in the measurement of convergence and asymmetry in inertial confinement fusion implosions. We present a quantitative model for the total resolution of a pinhole optic with an imaging detector that more effectively describes the effect of diffraction than models that treat geometry and diffraction as independent. This model can be used to predict loss of shape detail due to imaging across the transition from geometric to diffractive optics. We find that fractional error in observable shapes is proportional to the total resolution element we present and inversely proportional to the length scale of the asymmetry being observed. Finally, we have experimentally validated our results by imaging a single object with differently sized pinholes and with different magnifications.},
doi = {10.1364/AO.56.008719},
journal = {Applied Optics},
number = 31,
volume = 56,
place = {United States},
year = {Mon Oct 30 00:00:00 EDT 2017},
month = {Mon Oct 30 00:00:00 EDT 2017}
}
Web of Science
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Works referencing / citing this record:
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