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Title: Evaluation of neon focused ion beam milling for TEM sample preparation: TEM SAMPLE PREPARATION BY NE-MILLING

Authors:
 [1];  [1];  [1]
  1. Department of Materials Science and Engineering, University of California, Berkeley California U.S.A., The National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley California U.S.A.
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1401858
Grant/Contract Number:  
AC02-05CH11231; DMR-1338139
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Microscopy
Additional Journal Information:
Journal Name: Journal of Microscopy Journal Volume: 264 Journal Issue: 1; Journal ID: ISSN 0022-2720
Publisher:
Wiley-Blackwell
Country of Publication:
United Kingdom
Language:
English

Citation Formats

PEKIN, T. C., ALLEN, F. I., and MINOR, A. M. Evaluation of neon focused ion beam milling for TEM sample preparation: TEM SAMPLE PREPARATION BY NE-MILLING. United Kingdom: N. p., 2016. Web. doi:10.1111/jmi.12416.
PEKIN, T. C., ALLEN, F. I., & MINOR, A. M. Evaluation of neon focused ion beam milling for TEM sample preparation: TEM SAMPLE PREPARATION BY NE-MILLING. United Kingdom. doi:10.1111/jmi.12416.
PEKIN, T. C., ALLEN, F. I., and MINOR, A. M. Thu . "Evaluation of neon focused ion beam milling for TEM sample preparation: TEM SAMPLE PREPARATION BY NE-MILLING". United Kingdom. doi:10.1111/jmi.12416.
@article{osti_1401858,
title = {Evaluation of neon focused ion beam milling for TEM sample preparation: TEM SAMPLE PREPARATION BY NE-MILLING},
author = {PEKIN, T. C. and ALLEN, F. I. and MINOR, A. M.},
abstractNote = {},
doi = {10.1111/jmi.12416},
journal = {Journal of Microscopy},
number = 1,
volume = 264,
place = {United Kingdom},
year = {2016},
month = {5}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1111/jmi.12416

Citation Metrics:
Cited by: 6 works
Citation information provided by
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