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Title: Ordered and Patterned Assembly of Organic Micro/Nanocrystals for Flexible Electronic and Optoelectronic Devices

 [1];  [1];  [1];  [2];  [1]
  1. Institute of Functional Nano & Soft Materials (FUNSOM), Collaborative Innovation Center of Suzhou Nano Science and Technology (NANO-CIC), Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Soochow University, Suzhou Jiangsu 215123 P. R. China
  2. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley CA 94720 USA
Publication Date:
Sponsoring Org.:
OSTI Identifier:
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Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Advanced Materials Technologies
Additional Journal Information:
Journal Name: Advanced Materials Technologies Journal Volume: 2 Journal Issue: 7; Journal ID: ISSN 2365-709X
Wiley Blackwell (John Wiley & Sons)
Country of Publication:
United States

Citation Formats

Deng, Wei, Zhang, Xiujuan, Zhang, Xiaohong, Guo, Jinghua, and Jie, Jiansheng. Ordered and Patterned Assembly of Organic Micro/Nanocrystals for Flexible Electronic and Optoelectronic Devices. United States: N. p., 2017. Web. doi:10.1002/admt.201600280.
Deng, Wei, Zhang, Xiujuan, Zhang, Xiaohong, Guo, Jinghua, & Jie, Jiansheng. Ordered and Patterned Assembly of Organic Micro/Nanocrystals for Flexible Electronic and Optoelectronic Devices. United States. doi:10.1002/admt.201600280.
Deng, Wei, Zhang, Xiujuan, Zhang, Xiaohong, Guo, Jinghua, and Jie, Jiansheng. Thu . "Ordered and Patterned Assembly of Organic Micro/Nanocrystals for Flexible Electronic and Optoelectronic Devices". United States. doi:10.1002/admt.201600280.
title = {Ordered and Patterned Assembly of Organic Micro/Nanocrystals for Flexible Electronic and Optoelectronic Devices},
author = {Deng, Wei and Zhang, Xiujuan and Zhang, Xiaohong and Guo, Jinghua and Jie, Jiansheng},
abstractNote = {},
doi = {10.1002/admt.201600280},
journal = {Advanced Materials Technologies},
number = 7,
volume = 2,
place = {United States},
year = {2017},
month = {4}

Journal Article:
Free Publicly Available Full Text
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DOI: 10.1002/admt.201600280

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