Declamped Piezoelectric Coefficients in Patterned 70/30 Lead Magnesium Niobate–Lead Titanate Thin Films
Abstract
Lateral subdivision of blanket piezoelectric thin films increases the functional properties through both increased domain wall mobility and declamping of the intrinsic response. This work presents the local effects of substrate declamping on the piezoelectric coefficient d 33,f of 300 nm thick, rhombohedral, {001}‐oriented lead magnesium niobate–lead titanate thin films at the 70/30 composition (70PMN–30PT). Films grown by chemical solution deposition on platinized Si substrates are patterned into strip structures ranging from 0.75 to 9 µm in width. The longitudinal piezoelectric coefficient, d 33,f , is interrogated as a function of position across the patterned structures by three approaches: finite element modeling, piezoresponse force microscopy, and nanoprobe synchrotron X‐ray diffraction. It is found that d 33,f increases from the clamped value of 40–50 to ≈160 pm V −1 at the free sidewall under 200 kV cm −1 excitation. The sidewalls partially declamp the piezoelectric response 500–600 nm into the patterned structure, raising the piezoelectric response at the center of features with lateral dimensions less than 1 µm (3:1 width to thickness aspect ratio). The normalized data from all three methods are in excellent agreement, with quantitative differences providing insight to the field dependence of the piezoelectric coefficient and its declampingmore »
- Authors:
-
- Pennsylvania State Univ., University Park, PA (United States). Dept. of Materials Science and Engineering. Materials Research Inst.
- Univ. of Connecticut, Storrs, CT (United States). Dept. of Materials Science and Engineering. Inst. of Materials Science
- North Carolina State Univ., Raleigh, NC (United States). Dept. of Materials Science and Engineering
- Auburn Univ., AL (United States). Dept. of Physics
- Publication Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS); Univ. of Connecticut, Storrs, CT (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1356421
- Alternate Identifier(s):
- OSTI ID: 1401741
- Grant/Contract Number:
- AC02-06CH11357; SC0005037; DE‐SC0005037; DE‐AC02‐06CH11357
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Advanced Functional Materials
- Additional Journal Information:
- Journal Volume: 27; Journal Issue: 9; Journal ID: ISSN 1616-301X
- Publisher:
- Wiley
- Country of Publication:
- United States
- Language:
- ENGLISH
- Subject:
- 36 MATERIALS SCIENCE; thin films; lead magnesium niobate–lead titanate; piezoelectric materials; patterning; ferroelectric materials
Citation Formats
Keech, Ryan, Ye, Linghan, Bosse, James L., Esteves, Giovanni, Guerrier, Jonathon, Jones, Jacob L., Kuroda, Marcelo A., Huey, Bryan D., and Trolier‐McKinstry, Susan. Declamped Piezoelectric Coefficients in Patterned 70/30 Lead Magnesium Niobate–Lead Titanate Thin Films. United States: N. p., 2017.
Web. doi:10.1002/adfm.201605014.
Keech, Ryan, Ye, Linghan, Bosse, James L., Esteves, Giovanni, Guerrier, Jonathon, Jones, Jacob L., Kuroda, Marcelo A., Huey, Bryan D., & Trolier‐McKinstry, Susan. Declamped Piezoelectric Coefficients in Patterned 70/30 Lead Magnesium Niobate–Lead Titanate Thin Films. United States. https://doi.org/10.1002/adfm.201605014
Keech, Ryan, Ye, Linghan, Bosse, James L., Esteves, Giovanni, Guerrier, Jonathon, Jones, Jacob L., Kuroda, Marcelo A., Huey, Bryan D., and Trolier‐McKinstry, Susan. Wed .
"Declamped Piezoelectric Coefficients in Patterned 70/30 Lead Magnesium Niobate–Lead Titanate Thin Films". United States. https://doi.org/10.1002/adfm.201605014. https://www.osti.gov/servlets/purl/1356421.
@article{osti_1356421,
title = {Declamped Piezoelectric Coefficients in Patterned 70/30 Lead Magnesium Niobate–Lead Titanate Thin Films},
author = {Keech, Ryan and Ye, Linghan and Bosse, James L. and Esteves, Giovanni and Guerrier, Jonathon and Jones, Jacob L. and Kuroda, Marcelo A. and Huey, Bryan D. and Trolier‐McKinstry, Susan},
abstractNote = {Lateral subdivision of blanket piezoelectric thin films increases the functional properties through both increased domain wall mobility and declamping of the intrinsic response. This work presents the local effects of substrate declamping on the piezoelectric coefficient d 33,f of 300 nm thick, rhombohedral, {001}‐oriented lead magnesium niobate–lead titanate thin films at the 70/30 composition (70PMN–30PT). Films grown by chemical solution deposition on platinized Si substrates are patterned into strip structures ranging from 0.75 to 9 µm in width. The longitudinal piezoelectric coefficient, d 33,f , is interrogated as a function of position across the patterned structures by three approaches: finite element modeling, piezoresponse force microscopy, and nanoprobe synchrotron X‐ray diffraction. It is found that d 33,f increases from the clamped value of 40–50 to ≈160 pm V −1 at the free sidewall under 200 kV cm −1 excitation. The sidewalls partially declamp the piezoelectric response 500–600 nm into the patterned structure, raising the piezoelectric response at the center of features with lateral dimensions less than 1 µm (3:1 width to thickness aspect ratio). The normalized data from all three methods are in excellent agreement, with quantitative differences providing insight to the field dependence of the piezoelectric coefficient and its declamping behavior.},
doi = {10.1002/adfm.201605014},
journal = {Advanced Functional Materials},
number = 9,
volume = 27,
place = {United States},
year = {Wed Jan 18 00:00:00 EST 2017},
month = {Wed Jan 18 00:00:00 EST 2017}
}
Web of Science
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