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Title: Photovoltaic failure and degradation modes

Abstract

Abstract The extensive photovoltaic field reliability literature was analyzed and reviewed. Future work is prioritized based upon information assembled from recent installations, and inconsistencies in degradation mode identification are discussed to help guide future publication on this subject. Reported failure rates of photovoltaic modules fall mostly in the range of other consumer products; however, the long expected useful life of modules may not allow for direct comparison. In general, degradation percentages are reported to decrease appreciably in newer installations that are deployed after the year 2000. However, these trends may be convoluted with varying manufacturing and installation quality world‐wide. Modules in hot and humid climates show considerably higher degradation modes than those in desert and moderate climates, which warrants further investigation. Delamination and diode/j‐box issues are also more frequent in hot and humid climates than in other climates. The highest concerns of systems installed in the last 10 years appear to be hot spots followed by internal circuitry discoloration. Encapsulant discoloration was the most common degradation mode, particularly in older systems. In newer systems, encapsulant discoloration appears in hotter climates, but to a lesser degree. Thin‐film degradation modes are dominated by glass breakage and absorber corrosion, although the breadth of informationmore » for thin‐film modules is much smaller than for x‐Si. Copyright © 2017 John Wiley & Sons, Ltd.« less

Authors:
ORCiD logo [1];  [1];  [1];  [1];  [2]
  1. National Renewable Energy Lab. (NREL), Golden, CO (United States)
  2. Colorado School of Mines, Golden, CO (United States)
Publication Date:
Research Org.:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
OSTI Identifier:
1349023
Alternate Identifier(s):
OSTI ID: 1401511
Report Number(s):
NREL/JA-5J00-67238
Journal ID: ISSN 1062-7995
Grant/Contract Number:  
AC36-08GO28308; DE‐AC36‐08‐GO28308
Resource Type:
Accepted Manuscript
Journal Name:
Progress in Photovoltaics
Additional Journal Information:
Journal Volume: 25; Journal Issue: 4; Journal ID: ISSN 1062-7995
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 47 OTHER INSTRUMENTATION; photovoltaic modules; reliability; durability; failure; failure rate; degradation modes

Citation Formats

Jordan, Dirk C., Silverman, Timothy J., Wohlgemuth, John H., Kurtz, Sarah R., and VanSant, Kaitlyn T. Photovoltaic failure and degradation modes. United States: N. p., 2017. Web. doi:10.1002/pip.2866.
Jordan, Dirk C., Silverman, Timothy J., Wohlgemuth, John H., Kurtz, Sarah R., & VanSant, Kaitlyn T. Photovoltaic failure and degradation modes. United States. https://doi.org/10.1002/pip.2866
Jordan, Dirk C., Silverman, Timothy J., Wohlgemuth, John H., Kurtz, Sarah R., and VanSant, Kaitlyn T. Mon . "Photovoltaic failure and degradation modes". United States. https://doi.org/10.1002/pip.2866. https://www.osti.gov/servlets/purl/1349023.
@article{osti_1349023,
title = {Photovoltaic failure and degradation modes},
author = {Jordan, Dirk C. and Silverman, Timothy J. and Wohlgemuth, John H. and Kurtz, Sarah R. and VanSant, Kaitlyn T.},
abstractNote = {Abstract The extensive photovoltaic field reliability literature was analyzed and reviewed. Future work is prioritized based upon information assembled from recent installations, and inconsistencies in degradation mode identification are discussed to help guide future publication on this subject. Reported failure rates of photovoltaic modules fall mostly in the range of other consumer products; however, the long expected useful life of modules may not allow for direct comparison. In general, degradation percentages are reported to decrease appreciably in newer installations that are deployed after the year 2000. However, these trends may be convoluted with varying manufacturing and installation quality world‐wide. Modules in hot and humid climates show considerably higher degradation modes than those in desert and moderate climates, which warrants further investigation. Delamination and diode/j‐box issues are also more frequent in hot and humid climates than in other climates. The highest concerns of systems installed in the last 10 years appear to be hot spots followed by internal circuitry discoloration. Encapsulant discoloration was the most common degradation mode, particularly in older systems. In newer systems, encapsulant discoloration appears in hotter climates, but to a lesser degree. Thin‐film degradation modes are dominated by glass breakage and absorber corrosion, although the breadth of information for thin‐film modules is much smaller than for x‐Si. Copyright © 2017 John Wiley & Sons, Ltd.},
doi = {10.1002/pip.2866},
journal = {Progress in Photovoltaics},
number = 4,
volume = 25,
place = {United States},
year = {Mon Jan 30 00:00:00 EST 2017},
month = {Mon Jan 30 00:00:00 EST 2017}
}

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