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Title: The Change of X‐ray Diffraction Peak Width During in situ Conventional Sintering of Nanoscale Powders

Abstract

Diffraction peaks of nanoscale particles of 3 mol% yttria‐stabilized zirconia become sharper as the powder sinters. The reduction in the peak width is correlated with the increase in density. The sharpening of the peak agrees reasonably well with the remaining free surface area as the sample sinters. Therefore, high curvature of the free surface of the pores is assumed to lead to peak broadening (the grain boundaries that grow at the expense of the free surfaces of the pores do not have this curvature). The change in the grain size during sintering does not make a significant contribution to peak width.

Authors:
 [1];  [2];  [2];  [3];  [3];  [2];
  1. Department of Mechanical Engineering University of Colorado at Boulder Boulder 80309, Northboro Research &, Development Center Saint‐Gobain Innovative Materials Northboro Massachusetts 01532
  2. Department of Mechanical Engineering University of Colorado at Boulder Boulder 80309
  3. Department of Materials Science and Engineering University of Illinois Champaign Urbana Illinois 61801
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1401170
Grant/Contract Number:  
DE‐AC02‐06CH11357
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of the American Ceramic Society
Additional Journal Information:
Journal Name: Journal of the American Ceramic Society Journal Volume: 99 Journal Issue: 3; Journal ID: ISSN 0002-7820
Publisher:
Wiley-Blackwell
Country of Publication:
United States
Language:
English

Citation Formats

Lebrun, Jean‐Marie, Jha, Shikhar K., Naik, Kiran S., Seymour, Kevin C., Kriven, Waltraud M., Raj, Rishi, and Bordia, ed., R. The Change of X‐ray Diffraction Peak Width During in situ Conventional Sintering of Nanoscale Powders. United States: N. p., 2016. Web. doi:10.1111/jace.14112.
Lebrun, Jean‐Marie, Jha, Shikhar K., Naik, Kiran S., Seymour, Kevin C., Kriven, Waltraud M., Raj, Rishi, & Bordia, ed., R. The Change of X‐ray Diffraction Peak Width During in situ Conventional Sintering of Nanoscale Powders. United States. https://doi.org/10.1111/jace.14112
Lebrun, Jean‐Marie, Jha, Shikhar K., Naik, Kiran S., Seymour, Kevin C., Kriven, Waltraud M., Raj, Rishi, and Bordia, ed., R. Fri . "The Change of X‐ray Diffraction Peak Width During in situ Conventional Sintering of Nanoscale Powders". United States. https://doi.org/10.1111/jace.14112.
@article{osti_1401170,
title = {The Change of X‐ray Diffraction Peak Width During in situ Conventional Sintering of Nanoscale Powders},
author = {Lebrun, Jean‐Marie and Jha, Shikhar K. and Naik, Kiran S. and Seymour, Kevin C. and Kriven, Waltraud M. and Raj, Rishi and Bordia, ed., R.},
abstractNote = {Diffraction peaks of nanoscale particles of 3 mol% yttria‐stabilized zirconia become sharper as the powder sinters. The reduction in the peak width is correlated with the increase in density. The sharpening of the peak agrees reasonably well with the remaining free surface area as the sample sinters. Therefore, high curvature of the free surface of the pores is assumed to lead to peak broadening (the grain boundaries that grow at the expense of the free surfaces of the pores do not have this curvature). The change in the grain size during sintering does not make a significant contribution to peak width.},
doi = {10.1111/jace.14112},
journal = {Journal of the American Ceramic Society},
number = 3,
volume = 99,
place = {United States},
year = {Fri Jan 22 00:00:00 EST 2016},
month = {Fri Jan 22 00:00:00 EST 2016}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1111/jace.14112

Citation Metrics:
Cited by: 9 works
Citation information provided by
Web of Science

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Works referenced in this record:

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