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Title: Sub-Micrometer Zeolite Films on Gold-Coated Silicon Wafers with Single-Crystal-Like Dielectric Constant and Elastic Modulus

Authors:
 [1] ;  [2] ;  [2] ;  [2] ;  [3] ;  [4] ;  [5] ;  [2] ;  [3] ;  [6] ;  [1] ;  [2]
  1. Department of Medical and Surgical Sciences, University Magna Graecia of Catanzaro, Viale Europa 88100 Catanzaro Italy
  2. Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave SE Minneapolis MN 55455 USA
  3. Department of Chemistry and Chemistry Theory Center, University of Minnesota, 207 Pleasant St SE Minneapolis MN 55455 USA
  4. Characterization Facility, University of Minnesota, 12 Shepherd Labs, 100 Union St. S.E. Minneapolis MN 55455 USA
  5. Surface Scattering and Microdiffraction, X-ray Science Division, Argonne National Laboratory, 9700 S. Cass Ave, Building 438-D002 Argonne IL 60439 USA
  6. Department of Health Sciences, University Magna Graecia of Catanzaro, Viale Europa 88100 Catanzaro Italy
Publication Date:
Grant/Contract Number:
SC0001015; AC02-06CH11357; DEFG02-12ER16362
Type:
Publisher's Accepted Manuscript
Journal Name:
Advanced Functional Materials
Additional Journal Information:
Journal Name: Advanced Functional Materials Journal Volume: 27 Journal Issue: 25; Journal ID: ISSN 1616-301X
Publisher:
Wiley Blackwell (John Wiley & Sons)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
Germany
Language:
English
OSTI Identifier:
1401081

Tiriolo, Raffaele, Rangnekar, Neel, Zhang, Han, Shete, Meera, Bai, Peng, Nelson, John, Karapetrova, Evguenia, Macosko, Christopher W., Siepmann, Joern Ilja, Lamanna, Ernesto, Lavano, Angelo, and Tsapatsis, Michael. Sub-Micrometer Zeolite Films on Gold-Coated Silicon Wafers with Single-Crystal-Like Dielectric Constant and Elastic Modulus. Germany: N. p., Web. doi:10.1002/adfm.201700864.
Tiriolo, Raffaele, Rangnekar, Neel, Zhang, Han, Shete, Meera, Bai, Peng, Nelson, John, Karapetrova, Evguenia, Macosko, Christopher W., Siepmann, Joern Ilja, Lamanna, Ernesto, Lavano, Angelo, & Tsapatsis, Michael. Sub-Micrometer Zeolite Films on Gold-Coated Silicon Wafers with Single-Crystal-Like Dielectric Constant and Elastic Modulus. Germany. doi:10.1002/adfm.201700864.
Tiriolo, Raffaele, Rangnekar, Neel, Zhang, Han, Shete, Meera, Bai, Peng, Nelson, John, Karapetrova, Evguenia, Macosko, Christopher W., Siepmann, Joern Ilja, Lamanna, Ernesto, Lavano, Angelo, and Tsapatsis, Michael. 2017. "Sub-Micrometer Zeolite Films on Gold-Coated Silicon Wafers with Single-Crystal-Like Dielectric Constant and Elastic Modulus". Germany. doi:10.1002/adfm.201700864.
@article{osti_1401081,
title = {Sub-Micrometer Zeolite Films on Gold-Coated Silicon Wafers with Single-Crystal-Like Dielectric Constant and Elastic Modulus},
author = {Tiriolo, Raffaele and Rangnekar, Neel and Zhang, Han and Shete, Meera and Bai, Peng and Nelson, John and Karapetrova, Evguenia and Macosko, Christopher W. and Siepmann, Joern Ilja and Lamanna, Ernesto and Lavano, Angelo and Tsapatsis, Michael},
abstractNote = {},
doi = {10.1002/adfm.201700864},
journal = {Advanced Functional Materials},
number = 25,
volume = 27,
place = {Germany},
year = {2017},
month = {5}
}

Works referenced in this record:

From ultrasoft pseudopotentials to the projector augmented-wave method
journal, January 1999

An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments
journal, June 1992
  • Oliver, W. C.; Pharr, G. M.
  • Journal of Materials Research, Vol. 7, Issue 06, p. 1564-1583
  • DOI: 10.1557/JMR.1992.1564