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Title: Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures

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Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Name: Physical Review Letters Journal Volume: 119 Journal Issue: 16; Journal ID: ISSN 0031-9007
American Physical Society
Country of Publication:
United States

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Ferron, Thomas, Pope, Michael, and Collins, Brian A. Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures. United States: N. p., 2017. Web.
Ferron, Thomas, Pope, Michael, & Collins, Brian A. Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures. United States.
Ferron, Thomas, Pope, Michael, and Collins, Brian A. Thu . "Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures". United States.
title = {Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures},
author = {Ferron, Thomas and Pope, Michael and Collins, Brian A.},
abstractNote = {},
doi = {10.1103/PhysRevLett.119.167801},
journal = {Physical Review Letters},
number = 16,
volume = 119,
place = {United States},
year = {2017},
month = {10}

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