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Title: Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures

Authors:
; ;
Publication Date:
Grant/Contract Number:
AC02-05CH11231
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Name: Physical Review Letters Journal Volume: 119 Journal Issue: 16; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1400340

Ferron, Thomas, Pope, Michael, and Collins, Brian A. Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures. United States: N. p., Web. doi:10.1103/PhysRevLett.119.167801.
Ferron, Thomas, Pope, Michael, & Collins, Brian A. Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures. United States. doi:10.1103/PhysRevLett.119.167801.
Ferron, Thomas, Pope, Michael, and Collins, Brian A. 2017. "Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures". United States. doi:10.1103/PhysRevLett.119.167801.
@article{osti_1400340,
title = {Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures},
author = {Ferron, Thomas and Pope, Michael and Collins, Brian A.},
abstractNote = {},
doi = {10.1103/PhysRevLett.119.167801},
journal = {Physical Review Letters},
number = 16,
volume = 119,
place = {United States},
year = {2017},
month = {10}
}

Works referenced in this record:

X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92
journal, July 1993
  • Henke, B. L.; Gullikson, E. M.; Davis, J. C.
  • Atomic Data and Nuclear Data Tables, Vol. 54, Issue 2, p. 181-342
  • DOI: 10.1006/adnd.1993.1013