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Title: Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures

Authors:
; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1400340
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Name: Physical Review Letters Journal Volume: 119 Journal Issue: 16; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Ferron, Thomas, Pope, Michael, and Collins, Brian A. Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures. United States: N. p., 2017. Web. doi:10.1103/PhysRevLett.119.167801.
Ferron, Thomas, Pope, Michael, & Collins, Brian A. Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures. United States. doi:10.1103/PhysRevLett.119.167801.
Ferron, Thomas, Pope, Michael, and Collins, Brian A. Thu . "Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures". United States. doi:10.1103/PhysRevLett.119.167801.
@article{osti_1400340,
title = {Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures},
author = {Ferron, Thomas and Pope, Michael and Collins, Brian A.},
abstractNote = {},
doi = {10.1103/PhysRevLett.119.167801},
journal = {Physical Review Letters},
number = 16,
volume = 119,
place = {United States},
year = {2017},
month = {10}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevLett.119.167801

Citation Metrics:
Cited by: 5 works
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