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Title: Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film

Abstract

We extend the theory for scattering by oblique columnar structure thin films to include the induced form birefringence and the propagation of radiation in those films. We generalize the 4 × 4 matrix theory to include arbitrary sources in the layer, which are necessary to determine the Green function for the inhomogeneous wave equation. We further extend first-order vector perturbation theory for scattering by roughness in the smooth surface limit, when the layer is anisotropic. Scattering by an inhomogeneous medium is approximated by a distorted Born approximation, where effective medium theory is used to determine the effective properties of the medium and strong fluctuation theory is used to determine the inhomogeneous sources. In this manner, we develop a model for scattering by inhomogeneous films, with anisotropic correlation functions. Here, the results are compared to Mueller matrix bidirectional scattering distribution function measurements for a glancing-angle deposition (GLAD) film. While the results are applied to the GLAD film example, the development of the theory is general enough that it can guide simulations for scattering in other anisotropic thin films.

Authors:
 [1];  [2];  [2];  [2]
  1. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
  2. Univ. of Rochester, Rochester, NY (United States)
Publication Date:
Research Org.:
Univ. of Rochester, Rochester, NY (United States). Laboratory for Laser Energetics
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
Contributing Org.:
Laboratory for Laser Energetics, University of Rochester
OSTI Identifier:
1400250
Alternate Identifier(s):
OSTI ID: 1399644
Report Number(s):
2017-116, 1355
Journal ID: ISSN 1084-7529; JOAOD6; 2017-116, 2310, 1355
Grant/Contract Number:  
NA0001944
Resource Type:
Accepted Manuscript
Journal Name:
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
Additional Journal Information:
Journal Volume: 34; Journal Issue: 11; Journal ID: ISSN 1084-7529
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; Scattering measurements; BSDF; BRDF; BTDF

Citation Formats

Germer, Thomas A., Sharma, Katelynn A., Brown, Thomas G., and Oliver, James B. Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film. United States: N. p., 2017. Web. doi:10.1364/JOSAA.34.001974.
Germer, Thomas A., Sharma, Katelynn A., Brown, Thomas G., & Oliver, James B. Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film. United States. doi:10.1364/JOSAA.34.001974.
Germer, Thomas A., Sharma, Katelynn A., Brown, Thomas G., and Oliver, James B. Wed . "Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film". United States. doi:10.1364/JOSAA.34.001974. https://www.osti.gov/servlets/purl/1400250.
@article{osti_1400250,
title = {Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film},
author = {Germer, Thomas A. and Sharma, Katelynn A. and Brown, Thomas G. and Oliver, James B.},
abstractNote = {We extend the theory for scattering by oblique columnar structure thin films to include the induced form birefringence and the propagation of radiation in those films. We generalize the 4 × 4 matrix theory to include arbitrary sources in the layer, which are necessary to determine the Green function for the inhomogeneous wave equation. We further extend first-order vector perturbation theory for scattering by roughness in the smooth surface limit, when the layer is anisotropic. Scattering by an inhomogeneous medium is approximated by a distorted Born approximation, where effective medium theory is used to determine the effective properties of the medium and strong fluctuation theory is used to determine the inhomogeneous sources. In this manner, we develop a model for scattering by inhomogeneous films, with anisotropic correlation functions. Here, the results are compared to Mueller matrix bidirectional scattering distribution function measurements for a glancing-angle deposition (GLAD) film. While the results are applied to the GLAD film example, the development of the theory is general enough that it can guide simulations for scattering in other anisotropic thin films.},
doi = {10.1364/JOSAA.34.001974},
journal = {Journal of the Optical Society of America. A, Optics, Image Science, and Vision},
number = 11,
volume = 34,
place = {United States},
year = {2017},
month = {10}
}

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Works referenced in this record:

BRDF measurements of graphite used in high-temperature fixed point blackbody radiators: a multi-angle study at 405 nm and 658 nm
journal, March 2012


Scatter from tilted-columnar birefringent thin films: observation and measurement of anisotropic scatter distributions
journal, January 1995

  • Hodgkinson, Ian J.; Bowmar, Peter I.; Wu, Qi hong
  • Applied Optics, Vol. 34, Issue 1
  • DOI: 10.1364/AO.34.000163

Goniometric optical scatter instrument for out-of-plane ellipsometry measurements
journal, September 1999

  • Germer, Thomas A.; Asmail, Clara C.
  • Review of Scientific Instruments, Vol. 70, Issue 9
  • DOI: 10.1063/1.1149950

Green'S Function for an Infinite Anisotropic Medium. Review
journal, January 2015

  • Pazynin, Leonid Aleksandrovich; Sautbekov, S.; Sirenko, Yurii Konstantinovich
  • Telecommunications and Radio Engineering, Vol. 74, Issue 12
  • DOI: 10.1615/TelecomRadEng.v74.i12.10

Optics in Stratified and Anisotropic Media: 4×4-Matrix Formulation
journal, January 1972


General and self-consistent method for the calibration of polarization modulators, polarimeters, and Mueller-matrix ellipsometers
journal, January 1999

  • Compain, Eric; Poirier, Stéphane; Drevillon, Bernard
  • Applied Optics, Vol. 38, Issue 16
  • DOI: 10.1364/AO.38.003490

Polarization beam smoothing for inertial confinement fusion
journal, April 2000

  • Rothenberg, Joshua E.
  • Journal of Applied Physics, Vol. 87, Issue 8
  • DOI: 10.1063/1.372395

Conductivity of inhomogeneous materials: Effective-medium theory with dipole-dipole interaction
journal, August 1978


Measurement of Roughness of Two Interfaces of a Dielectric Film by Scattering Ellipsometry
journal, July 2000


Light scattering from thin films with an oblique columnar structure and with granular inclusions
journal, January 1995

  • Kassam, Samer; Hodgkinson, Ian J.; Wu, Qi hong
  • Journal of the Optical Society of America A, Vol. 12, Issue 9
  • DOI: 10.1364/JOSAA.12.002009

Irradiation uniformity for high-compression laser-fusion experiments
journal, May 1999

  • Skupsky, S.; Craxton, R. S.
  • Physics of Plasmas, Vol. 6, Issue 5
  • DOI: 10.1063/1.873501

Electron-beam–deposited distributed polarization rotator for high-power laser applications
journal, January 2014

  • Oliver, J. B.; Kessler, T. J.; Smith, C.
  • Optics Express, Vol. 22, Issue 20
  • DOI: 10.1364/OE.22.023883

Multilayer-coated optics: guided-wave coupling and scattering by means of interface random roughness
journal, January 1995


On the Representation of the Electric and Magnetic Fields Produced by Currents and Discontinuities in Wave Guides. I
journal, June 1951

  • Marcuvitz, N.; Schwinger, J.
  • Journal of Applied Physics, Vol. 22, Issue 6
  • DOI: 10.1063/1.1700052

Ferroelectric thin films: Review of materials, properties, and applications
journal, September 2006

  • Setter, N.; Damjanovic, D.; Eng, L.
  • Journal of Applied Physics, Vol. 100, Issue 5
  • DOI: 10.1063/1.2336999

Glancing-angle–deposited magnesium oxide films for high-fluence applications
journal, January 2016

  • Oliver, J. B.; Smith, C.; Spaulding, J.
  • Optical Materials Express, Vol. 6, Issue 7
  • DOI: 10.1364/OME.6.002291

Polarized light scattering by microroughness and small defects in dielectric layers
journal, January 2001


Scattering of electromagnetic waves from random media with strong permittivity fluctuations
journal, May 1981


Porosity engineering in glancing angle deposition thin films
journal, February 2005


Polarization of out-of-plane scattering from microrough silicon
journal, January 1997

  • Germer, Thomas A.; Asmail, Clara C.; Scheer, Bradley W.
  • Optics Letters, Vol. 22, Issue 17
  • DOI: 10.1364/OL.22.001284

Liquid crystal chiroptical polarization rotators for the near-UV region: theory, materials, and device applications
conference, September 2013

  • Saulnier, D.; Taylor, B.; Marshall, K. L.
  • SPIE Organic Photonics + Electronics, SPIE Proceedings
  • DOI: 10.1117/12.2023713

Theory of radiation from sources immersed in anisotropic media
journal, July 1964

  • Wait, James R.
  • Journal of Research of the National Bureau of Standards Section B Mathematics and Mathematical Physics, Vol. 68B, Issue 3
  • DOI: 10.6028/jres.068B.018

Solitons in conducting polymers
journal, July 1988