Non-Fermi Liquid Behavior and Continuously Tunable Resistivity Exponents in the Anderson-Hubbard Model at Finite Temperature

Patel, Niravkumar D.; Mukherjee, Anamitra; Kaushal, Nitin; Moreo, Adriana; Dagotto, Elbio R.

doi:10.1103/PhysRevLett.119.086601

Title: Non-Fermi Liquid Behavior and Continuously Tunable Resistivity Exponents in the Anderson-Hubbard Model at Finite Temperature

Journal Article · 24 August 2017 · Physical Review Letters

DOI: https://doi.org/10.1103/PhysRevLett.119.086601 · OSTI ID:1399224

Patel, Niravkumar D. ^[1]; Mukherjee, Anamitra ^[2]; Kaushal, Nitin ^[1]; Moreo, Adriana ^[3]; Dagotto, Elbio R. ^[3]

The Univ. of Tennessee, Knoxville, TN (United States)
National Institute of Science Education and Research, Jatni (India)
The Univ. of Tennessee, Knoxville, TN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Here, we employ a recently developed computational many-body technique to study for the first time the half-filled Anderson-Hubbard model at finite temperature and arbitrary correlation U and disorder V strengths. Interestingly, the narrow zero temperature metallic range induced by disorder from the Mott insulator expands with increasing temperature in a manner resembling a quantum critical point. Our study of the resistivity temperature scaling T^α for this metal reveals non-Fermi liquid characteristics. Moreover, a continuous dependence of α on U and V from linear to nearly quadratic is observed. We argue that these exotic results arise from a systematic change with U and V of the “effective” disorder, a combination of quenched disorder and intrinsic localized spins.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1399224

Alternate ID(s):: OSTI ID: 1376938

Journal Information:: Physical Review Letters, Vol. 119, Issue 8; ISSN 0031-9007

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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