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Title: Atomic-scale structural evolution of Ta–Ni–Si amorphous metal thin films

Authors:
; ;
Publication Date:
Grant/Contract Number:
AC05-76RLO1830
Type:
Publisher's Accepted Manuscript
Journal Name:
Materials Letters
Additional Journal Information:
Journal Volume: 164; Journal Issue: C; Related Information: CHORUS Timestamp: 2018-09-18 04:22:42; Journal ID: ISSN 0167-577X
Publisher:
Elsevier
Sponsoring Org:
USDOE
Country of Publication:
Netherlands
Language:
English
OSTI Identifier:
1398707

Oleksak, Richard P., Devaraj, Arun, and Herman, Gregory S.. Atomic-scale structural evolution of Ta–Ni–Si amorphous metal thin films. Netherlands: N. p., Web. doi:10.1016/j.matlet.2015.10.112.
Oleksak, Richard P., Devaraj, Arun, & Herman, Gregory S.. Atomic-scale structural evolution of Ta–Ni–Si amorphous metal thin films. Netherlands. doi:10.1016/j.matlet.2015.10.112.
Oleksak, Richard P., Devaraj, Arun, and Herman, Gregory S.. 2016. "Atomic-scale structural evolution of Ta–Ni–Si amorphous metal thin films". Netherlands. doi:10.1016/j.matlet.2015.10.112.
@article{osti_1398707,
title = {Atomic-scale structural evolution of Ta–Ni–Si amorphous metal thin films},
author = {Oleksak, Richard P. and Devaraj, Arun and Herman, Gregory S.},
abstractNote = {},
doi = {10.1016/j.matlet.2015.10.112},
journal = {Materials Letters},
number = C,
volume = 164,
place = {Netherlands},
year = {2016},
month = {2}
}