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Title: Thermally ruggedized ITO transparent electrode films for high power optoelectronics

Abstract

Here, we present two strategies to minimize laser damage in transparent conductive films. The first consists of improving heat dissipation by selection of substrates with high thermal diffusivity or by addition of capping layer heatsinks. The second is reduction of bulk energy absorption by lowering free carrier density and increasing mobility, while maintaining film conductance with thicker films. Multi-pulse laser damage tests were performed on tin-doped indium oxide (ITO) films configured to improve optical lifetime damage performance. Conditions where improvements were not observed are also described. Finally, when bulk heating is not the dominant damage process, discrete defect-induced damage limits damage behavior.

Authors:
ORCiD logo; ; ; ; ; ; ;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1398300
Alternate Identifier(s):
OSTI ID: 1406438
Report Number(s):
LLNL-JRNL-737685
Journal ID: ISSN 1094-4087; OPEXFF
Grant/Contract Number:  
15-ERD-057; AC52-07NA27344
Resource Type:
Published Article
Journal Name:
Optics Express
Additional Journal Information:
Journal Name: Optics Express Journal Volume: 25 Journal Issue: 21; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 36 MATERIALS SCIENCE; Lasers and laser optics; Laser materials; Laser damage; Optics at surfaces

Citation Formats

Yoo, Jae-Hyuck, Matthews, Manyalibo, Ramsey, Phil, Barrios, Antonio Correa, Carter, Austin, Lange, Andrew, Bude, Jeff, and Elhadj, Selim. Thermally ruggedized ITO transparent electrode films for high power optoelectronics. United States: N. p., 2017. Web. https://doi.org/10.1364/OE.25.025533.
Yoo, Jae-Hyuck, Matthews, Manyalibo, Ramsey, Phil, Barrios, Antonio Correa, Carter, Austin, Lange, Andrew, Bude, Jeff, & Elhadj, Selim. Thermally ruggedized ITO transparent electrode films for high power optoelectronics. United States. https://doi.org/10.1364/OE.25.025533
Yoo, Jae-Hyuck, Matthews, Manyalibo, Ramsey, Phil, Barrios, Antonio Correa, Carter, Austin, Lange, Andrew, Bude, Jeff, and Elhadj, Selim. Fri . "Thermally ruggedized ITO transparent electrode films for high power optoelectronics". United States. https://doi.org/10.1364/OE.25.025533.
@article{osti_1398300,
title = {Thermally ruggedized ITO transparent electrode films for high power optoelectronics},
author = {Yoo, Jae-Hyuck and Matthews, Manyalibo and Ramsey, Phil and Barrios, Antonio Correa and Carter, Austin and Lange, Andrew and Bude, Jeff and Elhadj, Selim},
abstractNote = {Here, we present two strategies to minimize laser damage in transparent conductive films. The first consists of improving heat dissipation by selection of substrates with high thermal diffusivity or by addition of capping layer heatsinks. The second is reduction of bulk energy absorption by lowering free carrier density and increasing mobility, while maintaining film conductance with thicker films. Multi-pulse laser damage tests were performed on tin-doped indium oxide (ITO) films configured to improve optical lifetime damage performance. Conditions where improvements were not observed are also described. Finally, when bulk heating is not the dominant damage process, discrete defect-induced damage limits damage behavior.},
doi = {10.1364/OE.25.025533},
journal = {Optics Express},
number = 21,
volume = 25,
place = {United States},
year = {2017},
month = {10}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1364/OE.25.025533

Citation Metrics:
Cited by: 4 works
Citation information provided by
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Laser-induced damage on single-crystal metal surfaces
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Nanoscale surface tracking of laser material processing using phase shifting diffraction interferometry
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Thermal conductivity of thin amorphous alumina films
journal, April 1993


Heat accumulation during pulsed laser materials processing
journal, January 2014

  • Weber, Rudolf; Graf, Thomas; Berger, Peter
  • Optics Express, Vol. 22, Issue 9
  • DOI: 10.1364/OE.22.011312

Predicting multipulse laser-induced failure for molybdenum metal mirrors
journal, January 1991

  • Becker, Michael F.; Ma, Chunchi; Walser, Rodger M.
  • Applied Optics, Vol. 30, Issue 36
  • DOI: 10.1364/AO.30.005239

Fatigue Life Study of ITO/PET Specimens in Terms of Electrical Resistance and Stress/Strain Via Cyclic Bending Tests
journal, July 2013

  • Li, Tse-Chang; Han, Chang-Fu; Chen, Kuan-Ting
  • Journal of Display Technology, Vol. 9, Issue 7
  • DOI: 10.1109/JDT.2013.2251318

Bending Fatigue Study of Sputtered ITO on Flexible Substrate
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    Works referencing / citing this record:

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