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Title: An ultra-wideband CMOS PA with dummy filling for reliability

Authors:
; ; ; ; ;
Publication Date:
Grant/Contract Number:
FG02-99ER54531
Type:
Publisher's Accepted Manuscript
Journal Name:
Solid-State Electronics
Additional Journal Information:
Journal Volume: 129; Journal Issue: C; Related Information: CHORUS Timestamp: 2018-09-06 06:55:29; Journal ID: ISSN 0038-1101
Publisher:
Elsevier
Sponsoring Org:
USDOE
Country of Publication:
United Kingdom
Language:
English
OSTI Identifier:
1397393

Chang, Yu-Ting, Ye, Yu, Xu, Hongtao, Domier, Calvin, Luhmann, Jr, N. C., and Gu, Q. Jane. An ultra-wideband CMOS PA with dummy filling for reliability. United Kingdom: N. p., Web. doi:10.1016/j.sse.2016.11.015.
Chang, Yu-Ting, Ye, Yu, Xu, Hongtao, Domier, Calvin, Luhmann, Jr, N. C., & Gu, Q. Jane. An ultra-wideband CMOS PA with dummy filling for reliability. United Kingdom. doi:10.1016/j.sse.2016.11.015.
Chang, Yu-Ting, Ye, Yu, Xu, Hongtao, Domier, Calvin, Luhmann, Jr, N. C., and Gu, Q. Jane. 2017. "An ultra-wideband CMOS PA with dummy filling for reliability". United Kingdom. doi:10.1016/j.sse.2016.11.015.
@article{osti_1397393,
title = {An ultra-wideband CMOS PA with dummy filling for reliability},
author = {Chang, Yu-Ting and Ye, Yu and Xu, Hongtao and Domier, Calvin and Luhmann, Jr, N. C. and Gu, Q. Jane},
abstractNote = {},
doi = {10.1016/j.sse.2016.11.015},
journal = {Solid-State Electronics},
number = C,
volume = 129,
place = {United Kingdom},
year = {2017},
month = {3}
}