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Title: Superheating suppresses structural disorder in layered BiI3 semiconductors grown by the Bridgman method

Authors:
; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Biological and Environmental Research (BER) (SC-23)
OSTI Identifier:
1396695
Grant/Contract Number:  
NE0000730
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Crystal Growth
Additional Journal Information:
Journal Name: Journal of Crystal Growth Journal Volume: 433 Journal Issue: C; Journal ID: ISSN 0022-0248
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Johns, Paul M., Sulekar, Soumitra, Yeo, Shinyoung, Baciak, J. E., Bliss, Mary, and Nino, Juan C. Superheating suppresses structural disorder in layered BiI3 semiconductors grown by the Bridgman method. Netherlands: N. p., 2016. Web. doi:10.1016/j.jcrysgro.2015.10.019.
Johns, Paul M., Sulekar, Soumitra, Yeo, Shinyoung, Baciak, J. E., Bliss, Mary, & Nino, Juan C. Superheating suppresses structural disorder in layered BiI3 semiconductors grown by the Bridgman method. Netherlands. doi:10.1016/j.jcrysgro.2015.10.019.
Johns, Paul M., Sulekar, Soumitra, Yeo, Shinyoung, Baciak, J. E., Bliss, Mary, and Nino, Juan C. Fri . "Superheating suppresses structural disorder in layered BiI3 semiconductors grown by the Bridgman method". Netherlands. doi:10.1016/j.jcrysgro.2015.10.019.
@article{osti_1396695,
title = {Superheating suppresses structural disorder in layered BiI3 semiconductors grown by the Bridgman method},
author = {Johns, Paul M. and Sulekar, Soumitra and Yeo, Shinyoung and Baciak, J. E. and Bliss, Mary and Nino, Juan C.},
abstractNote = {},
doi = {10.1016/j.jcrysgro.2015.10.019},
journal = {Journal of Crystal Growth},
number = C,
volume = 433,
place = {Netherlands},
year = {2016},
month = {1}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.jcrysgro.2015.10.019

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Cited by: 1 work
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