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Title: Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Type:
Publisher's Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 169; Journal Issue: C; Related Information: CHORUS Timestamp: 2018-09-10 20:22:44; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Sponsoring Org:
USDOE
Country of Publication:
Netherlands
Language:
English
OSTI Identifier:
1396446

Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M. S., D'Alfonso, A. J., Allen, L. J., and Findlay, S. D.. Practical aspects of diffractive imaging using an atomic-scale coherent electron probe. Netherlands: N. p., Web. doi:10.1016/j.ultramic.2016.06.009.
Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M. S., D'Alfonso, A. J., Allen, L. J., & Findlay, S. D.. Practical aspects of diffractive imaging using an atomic-scale coherent electron probe. Netherlands. doi:10.1016/j.ultramic.2016.06.009.
Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M. S., D'Alfonso, A. J., Allen, L. J., and Findlay, S. D.. 2016. "Practical aspects of diffractive imaging using an atomic-scale coherent electron probe". Netherlands. doi:10.1016/j.ultramic.2016.06.009.
@article{osti_1396446,
title = {Practical aspects of diffractive imaging using an atomic-scale coherent electron probe},
author = {Chen, Z. and Weyland, M. and Ercius, P. and Ciston, J. and Zheng, C. and Fuhrer, M. S. and D'Alfonso, A. J. and Allen, L. J. and Findlay, S. D.},
abstractNote = {},
doi = {10.1016/j.ultramic.2016.06.009},
journal = {Ultramicroscopy},
number = C,
volume = 169,
place = {Netherlands},
year = {2016},
month = {10}
}