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Title: Design Rules for Tailoring Antireflection Properties of Hierarchical Optical Structures

Abstract

Hierarchical structures consisting of small sub-wavelength features stacked atop larger structures have been demonstrated as an effective means of reducing the reflectance of surfaces. However, optical devices require different antireflective properties depending on the application, and general unifying guidelines on hierarchical structures' design to attain a desired antireflection spectral response are still lacking. The type of reflectivity (diffuse, specular, or total/hemispherical) and its angular- and spectral-dependence are all dictated by the structural parameters. Through computational and experimental studies, guidelines have been devised to modify these various aspects of reflectivity across the solar spectrum by proper selection of the features of hierarchical structures. In this wavelength regime, micrometer-scale substructures dictate the long-wavelength spectral response and effectively reduce specular reflectance, whereas nanometer-scale substructures dictate primarily the visible wavelength spectral response and reduce diffuse reflectance. Coupling structures having these two length scales into hierarchical arrays impressively reduces surfaces' hemispherical reflectance across a broad spectrum of wavelengths and angles. Furthermore, such hierarchical structures in silicon are demonstrated having an average total reflectance across the solar spectrum of 1.1% (average weighted reflectance of 1% in the 280–2500 nm range of the AM 1.5 G spectrum) and specular reflectance <1% even at angles of incidence asmore » high as 67°.« less

Authors:
 [1];  [2];  [1];  [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Materials Science Division, Lawrence Livermore National Laboratory, Livermore CA 94551 USA
Publication Date:
Research Org.:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1404830
Alternate Identifier(s):
OSTI ID: 1395596
Report Number(s):
LLNL-JRNL-713005
Journal ID: ISSN 2195-1071
Grant/Contract Number:  
AC52-07NA27344; DE‐AC52‐07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
Advanced Optical Materials
Additional Journal Information:
Journal Volume: 5; Journal Issue: 13; Journal ID: ISSN 2195-1071
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 77 NANOSCIENCE AND NANOTECHNOLOGY; broadband and omnidirectional antireflectivity; hierarchical structures; silicon

Citation Formats

Leon, Juan J. Diaz, Hiszpanski, Anna M., Bond, Tiziana C., and Kuntz, Joshua D. Design Rules for Tailoring Antireflection Properties of Hierarchical Optical Structures. United States: N. p., 2017. Web. doi:10.1002/adom.201700080.
Leon, Juan J. Diaz, Hiszpanski, Anna M., Bond, Tiziana C., & Kuntz, Joshua D. Design Rules for Tailoring Antireflection Properties of Hierarchical Optical Structures. United States. https://doi.org/10.1002/adom.201700080
Leon, Juan J. Diaz, Hiszpanski, Anna M., Bond, Tiziana C., and Kuntz, Joshua D. Thu . "Design Rules for Tailoring Antireflection Properties of Hierarchical Optical Structures". United States. https://doi.org/10.1002/adom.201700080. https://www.osti.gov/servlets/purl/1404830.
@article{osti_1404830,
title = {Design Rules for Tailoring Antireflection Properties of Hierarchical Optical Structures},
author = {Leon, Juan J. Diaz and Hiszpanski, Anna M. and Bond, Tiziana C. and Kuntz, Joshua D.},
abstractNote = {Hierarchical structures consisting of small sub-wavelength features stacked atop larger structures have been demonstrated as an effective means of reducing the reflectance of surfaces. However, optical devices require different antireflective properties depending on the application, and general unifying guidelines on hierarchical structures' design to attain a desired antireflection spectral response are still lacking. The type of reflectivity (diffuse, specular, or total/hemispherical) and its angular- and spectral-dependence are all dictated by the structural parameters. Through computational and experimental studies, guidelines have been devised to modify these various aspects of reflectivity across the solar spectrum by proper selection of the features of hierarchical structures. In this wavelength regime, micrometer-scale substructures dictate the long-wavelength spectral response and effectively reduce specular reflectance, whereas nanometer-scale substructures dictate primarily the visible wavelength spectral response and reduce diffuse reflectance. Coupling structures having these two length scales into hierarchical arrays impressively reduces surfaces' hemispherical reflectance across a broad spectrum of wavelengths and angles. Furthermore, such hierarchical structures in silicon are demonstrated having an average total reflectance across the solar spectrum of 1.1% (average weighted reflectance of 1% in the 280–2500 nm range of the AM 1.5 G spectrum) and specular reflectance <1% even at angles of incidence as high as 67°.},
doi = {10.1002/adom.201700080},
journal = {Advanced Optical Materials},
number = 13,
volume = 5,
place = {United States},
year = {Thu May 18 00:00:00 EDT 2017},
month = {Thu May 18 00:00:00 EDT 2017}
}

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