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Title: Novel Multiferroic Phases and Phenomena in Epitaxial (111) BiFeO 3 Films

Authors:
ORCiD logo [1];  [2];  [1]
  1. Physics Department and Institute for Nanoscience and Engineering, University of Arkansas, Fayetteville AR 72701 USA
  2. Physics Department and Institute for Nanoscience and Engineering, University of Arkansas, Fayetteville AR 72701 USA, Key Laboratory of Computational Physical Sciences (Ministry of Education), State Key Laboratory of Surface Physics, and Department of Physics, Fudan University, Shanghai 200433 China
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1395405
Grant/Contract Number:  
ER-46612
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Advanced Electronic Materials
Additional Journal Information:
Journal Name: Advanced Electronic Materials Journal Volume: 3 Journal Issue: 12; Journal ID: ISSN 2199-160X
Publisher:
Wiley Blackwell (John Wiley & Sons)
Country of Publication:
United States
Language:
English

Citation Formats

Xu, Changsong, Xiang, Hongjun, and Bellaiche, Laurent. Novel Multiferroic Phases and Phenomena in Epitaxial (111) BiFeO 3 Films. United States: N. p., 2017. Web. doi:10.1002/aelm.201700332.
Xu, Changsong, Xiang, Hongjun, & Bellaiche, Laurent. Novel Multiferroic Phases and Phenomena in Epitaxial (111) BiFeO 3 Films. United States. doi:10.1002/aelm.201700332.
Xu, Changsong, Xiang, Hongjun, and Bellaiche, Laurent. Thu . "Novel Multiferroic Phases and Phenomena in Epitaxial (111) BiFeO 3 Films". United States. doi:10.1002/aelm.201700332.
@article{osti_1395405,
title = {Novel Multiferroic Phases and Phenomena in Epitaxial (111) BiFeO 3 Films},
author = {Xu, Changsong and Xiang, Hongjun and Bellaiche, Laurent},
abstractNote = {},
doi = {10.1002/aelm.201700332},
journal = {Advanced Electronic Materials},
number = 12,
volume = 3,
place = {United States},
year = {2017},
month = {9}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1002/aelm.201700332

Citation Metrics:
Cited by: 2 works
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