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Title: Mapping cation diffusion through lattice defects in epitaxial oxide thin films on the water-soluble buffer layer Sr 3 Al 2 O 6 using atomic resolution electron microscopy

Authors:
 [1] ;  [2] ;  [3] ;  [4] ; ORCiD logo [5]
  1. School of Electrical and Computer Engineering, Cornell University, Ithaca, New York 14853, USA
  2. Department of Physics, Stanford University, Stanford, California 94305, USA
  3. Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
  4. Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA, Department of Applied Physics, Stanford University, Stanford, California 94305, USA
  5. School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA, Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853, USA
Publication Date:
Grant/Contract Number:
AC02-76SF00515
Type:
Publisher's Accepted Manuscript
Journal Name:
APL Materials
Additional Journal Information:
Journal Name: APL Materials Journal Volume: 5 Journal Issue: 9; Journal ID: ISSN 2166-532X
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1394853