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Title: Three-dimensional mapping of crystalline ceramic waste form materials

Here, we demonstrate the use of synchrotron-based, transmission X-ray microscopy (TXM) and scanning electron microscopy to image the 3-D morphologies and spatial distributions of Ga-doped phases within model, single- and two-phase waste form material systems. Gallium doping levels consistent with those commonly used for nuclear waste immobilization (e.g., Ba 1.04Cs 0.24Ga 2.32Ti 5.68O 16) could be readily imaged. This analysis suggests that a minority phase with different stoichiometry/composition from the primary hollandite phase can be formed by the solid-state ceramic processing route with varying morphology (globular vs. cylindrical) as a function of Cs content. Our results represent a crucial step in developing the tools necessary to gain an improved understanding of the microstructural and chemical properties of waste form materials that influence their resistance to aqueous corrosion. This understanding will aid in the future design of higher durability waste form materials.
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  1. Univ. of Connecticut, Storrs, CT (United States). Dept. of Mechanical Engineering
  2. Clemson Univ., SC (United States). Dept. of Materials Science and Engineering
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource
  4. Savannah River Site (SRS), Aiken, SC (United States). Savannah River National Lab. (SRNL)
Publication Date:
Grant/Contract Number:
AC02-76SF00515; NE0008260, CFA-14-6357; NE0008260; CFA-14-6357
Accepted Manuscript
Journal Name:
Journal of the American Ceramic Society
Additional Journal Information:
Journal Volume: 100; Journal Issue: 8; Journal ID: ISSN 0002-7820
American Ceramic Society
Research Org:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org:
Country of Publication:
United States
12 MANAGEMENT OF RADIOACTIVE AND NON-RADIOACTIVE WASTES FROM NUCLEAR FACILITIES; nuclear waste; processing; scanning electron microscopy; synchrotron; transmission x-ray microscopy; x-ray computed tomography
OSTI Identifier:
Alternate Identifier(s):
OSTI ID: 1373824