skip to main content

DOE PAGESDOE PAGES

This content will become publicly available on August 1, 2018

Title: High Conduction Hopping Behavior Induced in Transition Metal Dichalcogenides by Percolating Defect Networks: Toward Atomically Thin Circuits

Authors:
ORCiD logo [1] ; ORCiD logo [1] ;  [2] ;  [1] ;  [2] ;  [2] ;  [3] ;  [2] ;  [2] ;  [2] ;  [2] ;  [2] ;  [4] ;  [5]
  1. Department of Materials Science and Engineering, University of Tennessee, Knoxville TN 37996 USA
  2. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN 37831 USA
  3. Department of Materials Science and Engineering, University of Tennessee, Knoxville TN 37996 USA, Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge TN 37831 USA
  4. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN 37831 USA, Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge TN 37831 USA
  5. Department of Materials Science and Engineering, University of Tennessee, Knoxville TN 37996 USA, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN 37831 USA
Publication Date:
Grant/Contract Number:
DOE DE-SC0002136
Type:
Publisher's Accepted Manuscript
Journal Name:
Advanced Functional Materials
Additional Journal Information:
Journal Volume: 27; Journal Issue: 36; Related Information: CHORUS Timestamp: 2017-09-22 08:01:23; Journal ID: ISSN 1616-301X
Publisher:
Wiley Blackwell (John Wiley & Sons)
Sponsoring Org:
USDOE
Country of Publication:
Germany
Language:
English
OSTI Identifier:
1394006