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Title: Near-field edge fringes at sharp material boundaries

Abstract

We have studied the formation of near-field fringes when sharp edges of materials are imaged using scattering-type scanning near-field optical microscope (s-SNOM). The materials we have investigated include dielectrics, metals, a near-perfect conductor, and those that possess anisotropic permittivity and hyperbolic dispersion. For our theoretical analysis, we use a technique that combines full-wave numerical simulations of tip-sample near-field interaction and signal demodulation at higher orders akin to what is done in typical s-SNOM experiments. Unlike previous tip-sample interaction near-field models, our advanced technique allows simulation of the realistic tip and sample structure. Our analysis clarifies edge imaging of recently emerged layered materials such as hexagonal boron nitride and transition metal dichalcogenides (in particular, molybdenum disulfide), as well as traditional plasmonic materials such as gold. Hexagonal boron nitride is studied at several wavelengths, including the wavelength where it possesses excitation of phonon-polaritons and hyperbolic dispersion. Based on our results of s-SNOM imaging in different demodulation orders, we specify resonant and non-resonant types of edges and describe the edge fringes for each case. We clarify near-field edge-fringe formation at material sharp boundaries, both outside bright fringes and the low-contrast region at the edge, and elaborate on the necessity of separating them frommore » propagating waves on the surface of polaritonic materials.« less

Authors:
ORCiD logo; ; ;
Publication Date:
Research Org.:
Georgia State Univ., Atlanta, GA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Science Foundation (NSF); US Air Force Office of Scientific Research (AFOSR)
OSTI Identifier:
1393723
Alternate Identifier(s):
OSTI ID: 1502492
Grant/Contract Number:  
SC0007043; 1553251; FA9559-16-1-0172
Resource Type:
Published Article
Journal Name:
Optics Express
Additional Journal Information:
Journal Name: Optics Express Journal Volume: 25 Journal Issue: 20; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; field enhancement; laser beams; near field scanning optical microscopy; phase modulation; spontaneous emission; surface waves

Citation Formats

Babicheva, V. E., Gamage, S., Stockman, M. I., and Abate, Y. Near-field edge fringes at sharp material boundaries. United States: N. p., 2017. Web. doi:10.1364/OE.25.023935.
Babicheva, V. E., Gamage, S., Stockman, M. I., & Abate, Y. Near-field edge fringes at sharp material boundaries. United States. doi:10.1364/OE.25.023935.
Babicheva, V. E., Gamage, S., Stockman, M. I., and Abate, Y. Thu . "Near-field edge fringes at sharp material boundaries". United States. doi:10.1364/OE.25.023935.
@article{osti_1393723,
title = {Near-field edge fringes at sharp material boundaries},
author = {Babicheva, V. E. and Gamage, S. and Stockman, M. I. and Abate, Y.},
abstractNote = {We have studied the formation of near-field fringes when sharp edges of materials are imaged using scattering-type scanning near-field optical microscope (s-SNOM). The materials we have investigated include dielectrics, metals, a near-perfect conductor, and those that possess anisotropic permittivity and hyperbolic dispersion. For our theoretical analysis, we use a technique that combines full-wave numerical simulations of tip-sample near-field interaction and signal demodulation at higher orders akin to what is done in typical s-SNOM experiments. Unlike previous tip-sample interaction near-field models, our advanced technique allows simulation of the realistic tip and sample structure. Our analysis clarifies edge imaging of recently emerged layered materials such as hexagonal boron nitride and transition metal dichalcogenides (in particular, molybdenum disulfide), as well as traditional plasmonic materials such as gold. Hexagonal boron nitride is studied at several wavelengths, including the wavelength where it possesses excitation of phonon-polaritons and hyperbolic dispersion. Based on our results of s-SNOM imaging in different demodulation orders, we specify resonant and non-resonant types of edges and describe the edge fringes for each case. We clarify near-field edge-fringe formation at material sharp boundaries, both outside bright fringes and the low-contrast region at the edge, and elaborate on the necessity of separating them from propagating waves on the surface of polaritonic materials.},
doi = {10.1364/OE.25.023935},
journal = {Optics Express},
number = 20,
volume = 25,
place = {United States},
year = {2017},
month = {9}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1364/OE.25.023935

Citation Metrics:
Cited by: 7 works
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