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Title: Radiative Thermal Annealing/in Situ X-ray Diffraction Study of Methylammonium Lead Triiodide: Effect of Antisolvent, Humidity, Annealing Temperature Profile, and Film Substrates

Authors:
ORCiD logo [1] ;  [2] ; ORCiD logo [2] ;  [3]
  1. National Renewable Energy Laboratory, Golden, Colorado 80401, United States; Department of Electrical, Computer, and Energy Engineering, University of Colorado Boulder, Boulder, Colorado 80309, United States
  2. Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States
  3. National Renewable Energy Laboratory, Golden, Colorado 80401, United States
Publication Date:
Report Number(s):
NREL/JA-5K00-68900
Journal ID: ISSN 0897-4756
Grant/Contract Number:
AC02-76SF00515; AC36-08G028308; EE0005951; AC36-08GO28308
Type:
Accepted Manuscript
Journal Name:
Chemistry of Materials
Additional Journal Information:
Journal Volume: 29; Journal Issue: 14; Journal ID: ISSN 0897-4756
Publisher:
American Chemical Society (ACS)
Research Org:
SLAC National Accelerator Lab., Menlo Park, CA (United States); National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; XRD; perovskites; solar
OSTI Identifier:
1393379
Alternate Identifier(s):
OSTI ID: 1390308

Dou, Benjia, Pool, Vanessa L., Toney, Michael F., and van Hest, Maikel F. A. M.. Radiative Thermal Annealing/in Situ X-ray Diffraction Study of Methylammonium Lead Triiodide: Effect of Antisolvent, Humidity, Annealing Temperature Profile, and Film Substrates. United States: N. p., Web. doi:10.1021/acs.chemmater.7b01467.
Dou, Benjia, Pool, Vanessa L., Toney, Michael F., & van Hest, Maikel F. A. M.. Radiative Thermal Annealing/in Situ X-ray Diffraction Study of Methylammonium Lead Triiodide: Effect of Antisolvent, Humidity, Annealing Temperature Profile, and Film Substrates. United States. doi:10.1021/acs.chemmater.7b01467.
Dou, Benjia, Pool, Vanessa L., Toney, Michael F., and van Hest, Maikel F. A. M.. 2017. "Radiative Thermal Annealing/in Situ X-ray Diffraction Study of Methylammonium Lead Triiodide: Effect of Antisolvent, Humidity, Annealing Temperature Profile, and Film Substrates". United States. doi:10.1021/acs.chemmater.7b01467. https://www.osti.gov/servlets/purl/1393379.
@article{osti_1393379,
title = {Radiative Thermal Annealing/in Situ X-ray Diffraction Study of Methylammonium Lead Triiodide: Effect of Antisolvent, Humidity, Annealing Temperature Profile, and Film Substrates},
author = {Dou, Benjia and Pool, Vanessa L. and Toney, Michael F. and van Hest, Maikel F. A. M.},
abstractNote = {},
doi = {10.1021/acs.chemmater.7b01467},
journal = {Chemistry of Materials},
number = 14,
volume = 29,
place = {United States},
year = {2017},
month = {7}
}