Near-edge X-ray refraction fine structure microscopy

Farmand, Maryam; Celestre, Richard; Denes, Peter; Kilcoyne, A. L. David; Marchesini, Stefano; Padmore, Howard; Tyliszczak, Tolek; Warwick, Tony; Shi, Xiaowen; Lee, James; Yu, Young -Sang; Cabana, Jordi; Joseph, John; Krishnan, Harinarayan; Perciano, Talita; Maia, Filipe R. N. C.; Shapiro, David A.

doi:10.1063/1.4975377

Title: Near-edge X-ray refraction fine structure microscopy

Journal Article · 06 February 2017 · Applied Physics Letters

DOI: https://doi.org/10.1063/1.4975377 · OSTI ID:1393120

Farmand, Maryam ^[1];

^[1]; Denes, Peter ^[1]; Kilcoyne, A. L. David ^[1]; Marchesini, Stefano ^[1]; Padmore, Howard ^[1]; Tyliszczak, Tolek ^[1]; Warwick, Tony ^[1]; Shi, Xiaowen ^[2]; Lee, James ^[2]; Yu, Young -Sang ^[3];

^[4]; Joseph, John ^[1]; Krishnan, Harinarayan ^[1];

^[1]; Maia, Filipe R. N. C. ^[5];

^[1]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Oregon, Eugene, OR (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Illinois at Chicago, Chicago, IL (United States)
Univ. of Illinois at Chicago, Chicago, IL (United States)
Uppsala Univ., Uppsala (Sweden)

We demonstrate a method for obtaining increased spatial resolution and specificity in nanoscale chemical composition maps through the use of full refractive reference spectra in soft x-ray spectro-microscopy. Using soft x-ray ptychography, we measure both the absorption and refraction of x-rays through pristine reference materials as a function of photon energy and use these reference spectra as the basis for decomposing spatially resolved spectra from a heterogeneous sample, thereby quantifying the composition at high resolution. While conventional instruments are limited to absorption contrast, our novel refraction based method takes advantage of the strongly energy dependent scattering cross-section and can see nearly five-fold improved spatial resolution on resonance.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE; USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR) (SC-21)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1393120

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 6 Vol. 110; ISSN APPLAB; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited By (5)

X-ray Microscopy Jacobsen, Chris Cambridge University Press https://doi.org/10.1017/9781139924542	book	January 2019
X-ray ptychography on low-dimensional hard-condensed matter materials Shi, Xiaowen; Burdet, Nicolas; Chen, Bo Applied Physics Reviews, Vol. 6, Issue 1 https://doi.org/10.1063/1.5045131	journal	March 2019
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Spatially correlated coherent diffractive imaging method Tao, Xulei; Xu, Zijian; Liu, Haigang Applied Optics, Vol. 57, Issue 22 https://doi.org/10.1364/ao.57.006527	journal	January 2018
X-ray microscopy Lider, V. V. Physics-Uspekhi, Vol. 60, Issue 2 https://doi.org/10.3367/ufne.2016.06.037830	journal	February 2017

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