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Title: On determination of charge transfer efficiency of thick, fully depleted CCDs with 55 Fe x-rays

Charge transfer efficiency (CTE) is one of the most important CCD characteristics. Our paper examines ways to optimize the algorithms used to analyze 55Fe x-ray data on the CCDs, as well as explores new types of observables for CTE determination that can be used for testing LSST CCDs. Furthermore, the observables are modeled employing simple Monte Carlo simulations to determine how the charge diffusion in thick, fully depleted silicon affects the measurement. The data is compared to the simulations for one of the observables, integral flux of the x-ray hit.
 [1] ;  [2] ;  [2]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States); Pacific Univ., Forest Grove, OR (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Report Number(s):
Journal ID: ISSN 1748-0221
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Journal of Instrumentation
Additional Journal Information:
Journal Volume: 12; Journal Issue: 07; Conference: Precision Astronomy with Fully Depleted CCDs, Upton, NY (United States), 01-02 Dec 2016; Journal ID: ISSN 1748-0221
Institute of Physics (IOP)
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
Country of Publication:
United States
79 ASTRONOMY AND ASTROPHYSICS; charge transport and multiplication in solid media; detector modelling and simulations II; photon detectors for UV; visible and IR photons; image processing
OSTI Identifier: