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Title: Small Angle X-ray Scattering for Nanoparticle Research

Abstract

X-ray scattering is a structural characterization tool that has impacted diverse fields of study. It is unique in its ability to examine materials in real time and under realistic sample environments, enabling researchers to understand morphology at nanometer and ångström length scales using complementary small and wide angle X-ray scattering (SAXS, WAXS), respectively. Herein, we focus on the use of SAXS to examine nanoscale particulate systems. We provide a theoretical foundation for X-ray scattering, considering both form factor and structure factor, as well as the use of correlation functions, which may be used to determine a particle’s size, size distribution, shape, and organization into hierarchal structures. The theory is expanded upon with contemporary use cases. Both transmission and reflection (grazing incidence) geometries are addressed, as well the combination of SAXS with other X-ray and non-X ray characterization tools. Furthermore, we conclude with an examination of several key areas of research where X-rays scattering has played a pivotal role, including in situ nanoparticle synthesis, nanoparticle assembly, and in operando studies of catalysts and energy storage materials. Throughout this review we highlight the unique capabilities of X-ray scattering for structural characterization of materials in their native environment.

Authors:
 [1];  [1];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1391950
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Chemical Reviews
Additional Journal Information:
Journal Volume: 116; Journal Issue: 18; Journal ID: ISSN 0009-2665
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE; SAXS; nanoparticle

Citation Formats

Li, Tao, Senesi, Andrew J., and Lee, Byeongdu. Small Angle X-ray Scattering for Nanoparticle Research. United States: N. p., 2016. Web. https://doi.org/10.1021/acs.chemrev.5b00690.
Li, Tao, Senesi, Andrew J., & Lee, Byeongdu. Small Angle X-ray Scattering for Nanoparticle Research. United States. https://doi.org/10.1021/acs.chemrev.5b00690
Li, Tao, Senesi, Andrew J., and Lee, Byeongdu. Thu . "Small Angle X-ray Scattering for Nanoparticle Research". United States. https://doi.org/10.1021/acs.chemrev.5b00690. https://www.osti.gov/servlets/purl/1391950.
@article{osti_1391950,
title = {Small Angle X-ray Scattering for Nanoparticle Research},
author = {Li, Tao and Senesi, Andrew J. and Lee, Byeongdu},
abstractNote = {X-ray scattering is a structural characterization tool that has impacted diverse fields of study. It is unique in its ability to examine materials in real time and under realistic sample environments, enabling researchers to understand morphology at nanometer and ångström length scales using complementary small and wide angle X-ray scattering (SAXS, WAXS), respectively. Herein, we focus on the use of SAXS to examine nanoscale particulate systems. We provide a theoretical foundation for X-ray scattering, considering both form factor and structure factor, as well as the use of correlation functions, which may be used to determine a particle’s size, size distribution, shape, and organization into hierarchal structures. The theory is expanded upon with contemporary use cases. Both transmission and reflection (grazing incidence) geometries are addressed, as well the combination of SAXS with other X-ray and non-X ray characterization tools. Furthermore, we conclude with an examination of several key areas of research where X-rays scattering has played a pivotal role, including in situ nanoparticle synthesis, nanoparticle assembly, and in operando studies of catalysts and energy storage materials. Throughout this review we highlight the unique capabilities of X-ray scattering for structural characterization of materials in their native environment.},
doi = {10.1021/acs.chemrev.5b00690},
journal = {Chemical Reviews},
number = 18,
volume = 116,
place = {United States},
year = {2016},
month = {4}
}

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