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Title: Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials

Abstract

A suite of non-destructive, three-dimensional X-ray microscopy techniques have recently been developed and used to characterize the microstructures of polycrystalline materials. These techniques utilize high-energy synchrotron radiation and include near-field and far-field diffraction microscopy (NF- and FF-HEDM, respectively) and absorption tomography. Several compatible sample environments have also been developed, enabling a wide range of 3D studies of material evolution. In this article, the FF-HEDM technique is described in detail, including its implementation at the 1-ID beamline of the Advanced Photon Source. Examples of how the information obtained from FF-HEDM can be used to deepen our understanding of structure-property-processing relationships in selected materials are presented.

Authors:
 [1];  [2];  [1];  [3];  [2];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Nuclear Engineering Division
  3. Max Planck Inst. for Iron Research, Dusseldorf (Germany)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE Office of Nuclear Energy (NE)
OSTI Identifier:
1390810
Grant/Contract Number:  
AC02-06CH11357; FG02-10ER46758
Resource Type:
Accepted Manuscript
Journal Name:
Microscopy Today
Additional Journal Information:
Journal Volume: 25; Journal Issue: 05; Journal ID: ISSN 1551-9295
Publisher:
Cambridge University Press
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Park, Jun-Sang, Zhang, Xuan, Kenesei, Peter, Wong, Su Leen, Li, Meimei, and Almer, Jonathan. Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials. United States: N. p., 2017. Web. doi:10.1017/S1551929517000827.
Park, Jun-Sang, Zhang, Xuan, Kenesei, Peter, Wong, Su Leen, Li, Meimei, & Almer, Jonathan. Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials. United States. doi:10.1017/S1551929517000827.
Park, Jun-Sang, Zhang, Xuan, Kenesei, Peter, Wong, Su Leen, Li, Meimei, and Almer, Jonathan. Thu . "Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials". United States. doi:10.1017/S1551929517000827. https://www.osti.gov/servlets/purl/1390810.
@article{osti_1390810,
title = {Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials},
author = {Park, Jun-Sang and Zhang, Xuan and Kenesei, Peter and Wong, Su Leen and Li, Meimei and Almer, Jonathan},
abstractNote = {A suite of non-destructive, three-dimensional X-ray microscopy techniques have recently been developed and used to characterize the microstructures of polycrystalline materials. These techniques utilize high-energy synchrotron radiation and include near-field and far-field diffraction microscopy (NF- and FF-HEDM, respectively) and absorption tomography. Several compatible sample environments have also been developed, enabling a wide range of 3D studies of material evolution. In this article, the FF-HEDM technique is described in detail, including its implementation at the 1-ID beamline of the Advanced Photon Source. Examples of how the information obtained from FF-HEDM can be used to deepen our understanding of structure-property-processing relationships in selected materials are presented.},
doi = {10.1017/S1551929517000827},
journal = {Microscopy Today},
number = 05,
volume = 25,
place = {United States},
year = {2017},
month = {8}
}

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