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This content will become publicly available on August 31, 2018

Title: Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials

A suite of non-destructive, three-dimensional X-ray microscopy techniques have recently been developed and used to characterize the microstructures of polycrystalline materials. These techniques utilize high-energy synchrotron radiation and include near-field and far-field diffraction microscopy (NF- and FF-HEDM, respectively) and absorption tomography. Several compatible sample environments have also been developed, enabling a wide range of 3D studies of material evolution. In this article, the FF-HEDM technique is described in detail, including its implementation at the 1-ID beamline of the Advanced Photon Source. Examples of how the information obtained from FF-HEDM can be used to deepen our understanding of structure-property-processing relationships in selected materials are presented.
Authors:
 [1] ;  [2] ;  [1] ;  [3] ;  [2] ;  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Nuclear Engineering Division
  3. Max Planck Inst. for Iron Research, Dusseldorf (Germany)
Publication Date:
Grant/Contract Number:
AC02-06CH11357; FG02-10ER46758
Type:
Accepted Manuscript
Journal Name:
Microscopy Today
Additional Journal Information:
Journal Volume: 25; Journal Issue: 05; Journal ID: ISSN 1551-9295
Publisher:
Cambridge University Press
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE Office of Nuclear Energy (NE)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE
OSTI Identifier:
1390810