3D lattice distortions and defect structures in ion-implanted nano-crystals
Abstract
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga+), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale revolutionised sample preparation across the life, earth and materials sciences. Despite its widespread usage, detailed understanding of the FIBinduced structural damage, intrinsic to the technique, remains elusive. Here we examine the defects caused by FIB in initially pristine objects. Using Bragg Coherent X-ray Diffraction Imaging (BCDI), we are able to spatially-resolve the full lattice strain tensor in FIB-milled gold nano-crystals. We find that every use of FIB causes large lattice distortions. Even very low ion doses, typical of FIB imaging and previously thought negligible, have a dramatic effect. Our results are consistent with a damage microstructure dominated by vacancies, highlighting the importance of free-surfaces in determining which defects are retained. At larger ion fluences, used during FIB-milling, we observe an extended dislocation network that causes stresses far beyond the bulk tensile strength of gold. These observations provide new fundamental insight into the nature of the damage created and the defects that lead to a surprisingly inhomogeneous morphology.
- Authors:
-
- Univ. of Oxford (United Kingdom). Dept. of Engineering Science
- Univ. College, London (United Kingdom). London Centre for Nanotechnology; Science and Technology Facilities Council (STFC), Oxford (United Kingdom). Rutherford Appleton Lab. (RAL)
- Univ. of Oxford (United Kingdom). Dept. of Materials
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source
- La Trobe Univ., Melbourne, VIC (Australia). ARC Centre of Advanced Molecular Imaging; CSIRO Manufacturing Flagship, CAN Parkville (Australia)
- SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science
- La Trobe Univ., Melbourne, VIC (Australia). ARC Centre of Advanced Molecular Imaging
- Publication Date:
- Research Org.:
- Brookhaven National Lab. (BNL), Upton, NY (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1349558
- Alternate Identifier(s):
- OSTI ID: 1360215; OSTI ID: 1390607
- Report Number(s):
- BNL-113662-2017-JA
Journal ID: ISSN 2045-2322; R&D Project: PO011; KC0201060
- Grant/Contract Number:
- SC00112704; AC02-76SF00515; AC02-06CH11357
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Scientific Reports
- Additional Journal Information:
- Journal Volume: 7; Journal ID: ISSN 2045-2322
- Publisher:
- Nature Publishing Group
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Citation Formats
Hofmann, Felix, Robinson, Ian K., Tarleton, Edmund, Harder, Ross J., Phillips, Nicholas W., Ma, Pui -Wai, Clark, Jesse N., Abbey, Brian, Liu, Wenjun, and Beck, Christian E. 3D lattice distortions and defect structures in ion-implanted nano-crystals. United States: N. p., 2017.
Web. doi:10.1038/srep45993.
Hofmann, Felix, Robinson, Ian K., Tarleton, Edmund, Harder, Ross J., Phillips, Nicholas W., Ma, Pui -Wai, Clark, Jesse N., Abbey, Brian, Liu, Wenjun, & Beck, Christian E. 3D lattice distortions and defect structures in ion-implanted nano-crystals. United States. https://doi.org/10.1038/srep45993
Hofmann, Felix, Robinson, Ian K., Tarleton, Edmund, Harder, Ross J., Phillips, Nicholas W., Ma, Pui -Wai, Clark, Jesse N., Abbey, Brian, Liu, Wenjun, and Beck, Christian E. Thu .
"3D lattice distortions and defect structures in ion-implanted nano-crystals". United States. https://doi.org/10.1038/srep45993. https://www.osti.gov/servlets/purl/1349558.
@article{osti_1349558,
title = {3D lattice distortions and defect structures in ion-implanted nano-crystals},
author = {Hofmann, Felix and Robinson, Ian K. and Tarleton, Edmund and Harder, Ross J. and Phillips, Nicholas W. and Ma, Pui -Wai and Clark, Jesse N. and Abbey, Brian and Liu, Wenjun and Beck, Christian E.},
abstractNote = {Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga+), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale revolutionised sample preparation across the life, earth and materials sciences. Despite its widespread usage, detailed understanding of the FIBinduced structural damage, intrinsic to the technique, remains elusive. Here we examine the defects caused by FIB in initially pristine objects. Using Bragg Coherent X-ray Diffraction Imaging (BCDI), we are able to spatially-resolve the full lattice strain tensor in FIB-milled gold nano-crystals. We find that every use of FIB causes large lattice distortions. Even very low ion doses, typical of FIB imaging and previously thought negligible, have a dramatic effect. Our results are consistent with a damage microstructure dominated by vacancies, highlighting the importance of free-surfaces in determining which defects are retained. At larger ion fluences, used during FIB-milling, we observe an extended dislocation network that causes stresses far beyond the bulk tensile strength of gold. These observations provide new fundamental insight into the nature of the damage created and the defects that lead to a surprisingly inhomogeneous morphology.},
doi = {10.1038/srep45993},
journal = {Scientific Reports},
number = ,
volume = 7,
place = {United States},
year = {Thu Apr 06 00:00:00 EDT 2017},
month = {Thu Apr 06 00:00:00 EDT 2017}
}
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