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Title: Secondary ion mass spectrometry: The application in the analysis of atmospheric particulate matter

Currently, considerable attention has been paid to atmospheric particulate matter (PM) investigation due to its importance in human health and global climate change. Surface characterization, single particle analysis and depth profiling of PM is important for a better understanding of its formation processes and predicting its impact on the environment and human being. Secondary ion mass spectrometry (SIMS) is a surface technique with high surface sensitivity, high spatial resolution chemical imaging and unique depth profiling capabilities. Recent research shows that SIMS has great potential in analyzing both surface and bulk chemical information of PM. In this review, we give a brief introduction of SIMS working principle and survey recent applications of SIMS in PM characterization. In particular, analyses from different types of PM sources by various SIMS techniques were discussed concerning their advantages and limitations. Finally, we propose, the future development and needs of SIMS in atmospheric aerosol measurement with a perspective in broader environmental sciences.
 [1] ;  [2] ;  [1] ;  [3] ;  [4] ;  [2]
  1. East China Univ. of Science and Technology, Shanghai (China). State Environmental Protection Key Lab. of Environmental Risk Assessment and Control on Chemical Processes
  2. East China Univ. of Science and Technology, Shanghai (China). Key Lab. for Advanced Materials, School of Chemistry and Molecular Engineering
  3. Qiqihar Univ. (China). College of Chemistry and Chemical Engineering
  4. Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Earth and Biological Sciences Directorate
Publication Date:
Grant/Contract Number:
AC05-76RL01830; 21327807; 21421004; 21277044; 68697
Accepted Manuscript
Journal Name:
Analytica Chimica Acta
Additional Journal Information:
Journal Volume: 989; Journal Issue: C; Journal ID: ISSN 0003-2670
Research Org:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org:
Country of Publication:
United States
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; Secondary ion mass spectrometry; Particulate matter; Aerosol; Surface analysis; Chemical heterogeneity
OSTI Identifier: