The Atomic Scale Electrochemical Lithiation and Delithiation Process of Silicon
Abstract
Abstract While silicon (Si) has tenfold capacity of commercially used graphite, its application is still limited due to its limited cyclability. In this in situ X‐ray reflectivity study, a detailed mechanistic model of the first two (de)lithiation processes of a silicon wafer is presented, which sheds light onto the fundamental difference of the reaction of Li ions with crystalline and amorphous materials. Furthermore, this study provides insight into the formation and further evolution of the inorganic solid electrolyte interphase (SEI) layer on Si anodes. The results show that the lithiation of crystalline Si is a layer‐by‐layer, reaction limited two‐phase process, but the delithiation of Li x Si (resulting in amorphous Si) and the lithiation of amorphous Si are reaction‐limited single‐phase processes. Furthermore, the thickness‐density product of the inorganic SEI layer increases during lithiation and decreases during delithiation, resembling a “breathing” behavior; the inorganic SEI layer thickness varies between 40 and 70 Å. Additionally, a low‐electron‐density “Li‐dip” layer is found between the SEI and lithiated Si during the delithiation process, suggesting kinetically limited ion transport within the SEI, which is speculated to be one of the origins of battery's internal resistance. Several implications of the findings on battery performance in generalmore »
- Authors:
-
- SSRL Materials Science Division SLAC National Accelerator Laboratory Menlo Park CA 94025 USA, Department of Materials Science and Engineering Stanford University Stanford CA 94305 USA
- SSRL Materials Science Division SLAC National Accelerator Laboratory Menlo Park CA 94025 USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1389664
- Grant/Contract Number:
- DE‐AC02‐76SF00515
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Advanced Materials Interfaces
- Additional Journal Information:
- Journal Name: Advanced Materials Interfaces Journal Volume: 4 Journal Issue: 22; Journal ID: ISSN 2196-7350
- Publisher:
- Wiley Blackwell (John Wiley & Sons)
- Country of Publication:
- Germany
- Language:
- English
Citation Formats
Cao, Chuntian, Steinrück, Hans‐Georg, Shyam, Badri, and Toney, Michael F. The Atomic Scale Electrochemical Lithiation and Delithiation Process of Silicon. Germany: N. p., 2017.
Web. doi:10.1002/admi.201700771.
Cao, Chuntian, Steinrück, Hans‐Georg, Shyam, Badri, & Toney, Michael F. The Atomic Scale Electrochemical Lithiation and Delithiation Process of Silicon. Germany. https://doi.org/10.1002/admi.201700771
Cao, Chuntian, Steinrück, Hans‐Georg, Shyam, Badri, and Toney, Michael F. Tue .
"The Atomic Scale Electrochemical Lithiation and Delithiation Process of Silicon". Germany. https://doi.org/10.1002/admi.201700771.
@article{osti_1389664,
title = {The Atomic Scale Electrochemical Lithiation and Delithiation Process of Silicon},
author = {Cao, Chuntian and Steinrück, Hans‐Georg and Shyam, Badri and Toney, Michael F.},
abstractNote = {Abstract While silicon (Si) has tenfold capacity of commercially used graphite, its application is still limited due to its limited cyclability. In this in situ X‐ray reflectivity study, a detailed mechanistic model of the first two (de)lithiation processes of a silicon wafer is presented, which sheds light onto the fundamental difference of the reaction of Li ions with crystalline and amorphous materials. Furthermore, this study provides insight into the formation and further evolution of the inorganic solid electrolyte interphase (SEI) layer on Si anodes. The results show that the lithiation of crystalline Si is a layer‐by‐layer, reaction limited two‐phase process, but the delithiation of Li x Si (resulting in amorphous Si) and the lithiation of amorphous Si are reaction‐limited single‐phase processes. Furthermore, the thickness‐density product of the inorganic SEI layer increases during lithiation and decreases during delithiation, resembling a “breathing” behavior; the inorganic SEI layer thickness varies between 40 and 70 Å. Additionally, a low‐electron‐density “Li‐dip” layer is found between the SEI and lithiated Si during the delithiation process, suggesting kinetically limited ion transport within the SEI, which is speculated to be one of the origins of battery's internal resistance. Several implications of the findings on battery performance in general are discussed.},
doi = {10.1002/admi.201700771},
journal = {Advanced Materials Interfaces},
number = 22,
volume = 4,
place = {Germany},
year = {Tue Sep 12 00:00:00 EDT 2017},
month = {Tue Sep 12 00:00:00 EDT 2017}
}
https://doi.org/10.1002/admi.201700771
Web of Science
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