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Title: Self-referenced single-shot THz detection

We demonstrate a self-referencing method to reduce noise in a single-shot terahertz detection scheme. By splitting a single terahertz pulse and using a reflective echelon, both the signal and reference terahertz time-domain waveforms were measured using one laser pulse. Simultaneous acquisition of these waveforms significantly reduces noise originating from shot-to-shot fluctuations. Here, we show that correlation function based referencing, which is not limited to polarization dependent measurements, can achieve a noise floor that is comparable to state-of-the-art polarization-gated balanced detection. Lastly, we extract the DC conductivity of a 30 nm free-standing gold film using a single THz pulse. The measured value of σ 0 = 1.3 ± 0.4 × 10 7 S m -1 is in good agreement with the value measured by four-point probe, indicating the viability of this method for measuring dynamical changes and small signals.
Authors:
 [1] ;  [2] ;  [3] ;  [3] ;  [4] ;  [3]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States); Univ. of Alberta, Edmonton, AB (Canada). Dept. of Electrical and Computer Engineering
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States); Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States). Dept. of Chemistry
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  4. Univ. of Alberta, Edmonton, AB (Canada). Dept. of Electrical and Computer Engineering
Publication Date:
Grant/Contract Number:
AC02-76SF00515; FWP 100182
Type:
Accepted Manuscript
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 25; Journal Issue: 14; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Research Org:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC), Fusion Energy Sciences (FES) (SC-24); Natural Sciences and Engineering Research Council of Canada (NSERC)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; Spectroscopy; terahertz; Ultrafast measurements; Ultrafast optics; Thin films
OSTI Identifier:
1380108