Multi-pass transmission electron microscopy
Abstract
Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of sensitive materials, such as single proteins or polymers. Here, we use simulations to show that an electron microscope based on a multi-pass measurement protocol enables imaging of single proteins, without averaging structures over multiple images. While we demonstrate the method for particular imaging targets, the approach is broadly applicable and is expected to improve resolution and sensitivity for a range of electron microscopy imaging modalities, including, for example, scanning and spectroscopic techniques. The approach implements a quantum mechanically optimal strategy which under idealized conditions can be considered interaction-free.
- Authors:
-
[1];
- Stanford Univ., CA (United States). Physics Dept.
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy
- Univ. of California, Berkeley, CA (United States). Molecular Biophysics and Integrative Bioimaging
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1379931
- Grant/Contract Number:
- AC02-05CH11231
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Scientific Reports
- Additional Journal Information:
- Journal Volume: 7; Journal Issue: 1; Journal ID: ISSN 2045-2322
- Publisher:
- Nature Publishing Group
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 59 BASIC BIOLOGICAL SCIENCES; 47 OTHER INSTRUMENTATION; cryoelectron microscopy; quantum metrology; transmission electron microscopy
Citation Formats
Juffmann, Thomas, Koppell, Stewart A., Klopfer, Brannon B., Ophus, Colin, Glaeser, Robert M., and Kasevich, Mark A. Multi-pass transmission electron microscopy. United States: N. p., 2017.
Web. doi:10.1038/s41598-017-01841-x.
Juffmann, Thomas, Koppell, Stewart A., Klopfer, Brannon B., Ophus, Colin, Glaeser, Robert M., & Kasevich, Mark A. Multi-pass transmission electron microscopy. United States. https://doi.org/10.1038/s41598-017-01841-x
Juffmann, Thomas, Koppell, Stewart A., Klopfer, Brannon B., Ophus, Colin, Glaeser, Robert M., and Kasevich, Mark A. Wed .
"Multi-pass transmission electron microscopy". United States. https://doi.org/10.1038/s41598-017-01841-x. https://www.osti.gov/servlets/purl/1379931.
@article{osti_1379931,
title = {Multi-pass transmission electron microscopy},
author = {Juffmann, Thomas and Koppell, Stewart A. and Klopfer, Brannon B. and Ophus, Colin and Glaeser, Robert M. and Kasevich, Mark A.},
abstractNote = {Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of sensitive materials, such as single proteins or polymers. Here, we use simulations to show that an electron microscope based on a multi-pass measurement protocol enables imaging of single proteins, without averaging structures over multiple images. While we demonstrate the method for particular imaging targets, the approach is broadly applicable and is expected to improve resolution and sensitivity for a range of electron microscopy imaging modalities, including, for example, scanning and spectroscopic techniques. The approach implements a quantum mechanically optimal strategy which under idealized conditions can be considered interaction-free.},
doi = {10.1038/s41598-017-01841-x},
journal = {Scientific Reports},
number = 1,
volume = 7,
place = {United States},
year = {Wed May 10 00:00:00 EDT 2017},
month = {Wed May 10 00:00:00 EDT 2017}
}
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