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Title: Note: Setup for chemical atmospheric control during in situ grazing incidence X-ray scattering of printed thin films

In order to tailor the assembling of polymers and organic molecules, a deeper understanding of the kinetics involved in thin film production is necessary. While post-production characterization only provides insight on the final film structure, more sophisticated experimental setups are needed to probe the structure formation processes in situ during deposition. The drying kinetics of a deposited organic thin film strongly influences the assembling process on the nanometer scale. Lastly, this work presents an experimental setup that enables fine control of the atmosphere composition surrounding the sample during slot die coating, while simultaneously probing the film formation kinetics using in situ grazing incidence X-ray scattering and spectroscopy.
Authors:
ORCiD logo [1] ;  [2] ;  [3] ;  [3] ;  [3] ;  [2] ;  [3] ; ORCiD logo [4]
  1. Technische Univ. Munchen, Garching (Germany). Munich School of Engineering, Herzig Group
  2. Technische Univ. Munchen, Garching (Germany). Physik Dept., Lehrstuhl fur Funktionelle Materialien
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
  4. Technische Univ. Munchen, Garching (Germany). Munich School of Engineering, Herzig Group; Univ. of Bayreuth (Germany). Experimentalphysik II
Publication Date:
Grant/Contract Number:
AC02-05CH11231
Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 88; Journal Issue: 6; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Research Org:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Thin film structure; Solvents; Metallic thin films; Copper; Thin film flows
OSTI Identifier:
1379872
Alternate Identifier(s):
OSTI ID: 1366555