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Title: Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction

We present that local crystal structure, crystal orientation, and crystal deformation can all be probed by Laue diffraction using a submicron x-ray beam. This technique, employed at a synchrotron facility, is particularly suitable for fast mapping the mechanical and microstructural properties of inhomogeneous multiphase polycrystalline samples, as well as imperfect epitaxial films or crystals. As synchrotron Laue x-ray microdiffraction enters its 20th year of existence and new synchrotron nanoprobe facilities are being built and commissioned around the world, we take the opportunity to overview current capabilities as well as the latest technical developments. Fast data collection provided by state-of-the-art area detectors and fully automated pattern indexing algorithms optimized for speed make it possible to map large portions of a sample with fine step size and obtain quantitative images of its microstructure in near real time. Lastly, we extrapolate how the technique is anticipated to evolve in the near future and its potential emerging applications at a free-electron laser facility.
 [1] ;  [2] ;  [3] ;  [4] ;  [5]
  1. Hong Kong University of Science and Technology (China). Department of Mechanical and Aerospace Engineering
  2. ETH Zurich (Switzerland). Department of Materials
  3. Univ. of Central Florida, Orlando, FL (United States). Department of Materials Science and Engineering and Advanced Materials Processing and Analysis Center
  4. National Synchrotron Radiation Research Center (Taiwan). Scientific Research Division
  5. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
Publication Date:
Grant/Contract Number:
Accepted Manuscript
Journal Name:
MRS Bulletin
Additional Journal Information:
Journal Volume: 41; Journal Issue: 06; Journal ID: ISSN 0883-7694
Materials Research Society
Research Org:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
36 MATERIALS SCIENCE; x-ray diffraction; crystallographic structure; phase transformation
OSTI Identifier: